Estimating the quality of stripe in structured light 3D measurement  

作　　者：XUE Qi JI Wenzhao MENG Hao SUN Xiaohong YE Huiying YANG Xiaonan 

机构地区：[1]School of Information Engineering,Zhengzhou University,Zhengzhou 450001,China

出　　处：《Optoelectronics Letters》2022年第2期103-108,共6页光电子快报（英文版）

基　　金：supported by the National Natural Science Foundation of China(Nos.61705198 and 61874099);the Certificate of Postdoctoral Research Grant in Henan Province(No.001801008);the Henan Innovation Demonstration Project(No.201111212300);the Zhengzhou Major Science and Technology Innovation Project(No.2019CXZX0037).

摘　　要：Affected by noise, light blocking, color and shape of object, the quality of captured stripes in structured light three dimensional(3 D) measurement system is degenerated. As the quality of captured stripes is one of the key factors for measurement accuracy, some large error data is introduced into the measurement results which can only be recognized artificially with prior knowledge of the object to be measured. In this paper, a method is proposed to estimate the quality of stripe image. In the method, two parameters, skewness coefficient of stripe gray distribution and the noise level, are used to estimate the quality of stripe. The simulation results show that the bigger the skewness coefficient is, the bigger the error of stripe locating results is. Meanwhile, the smaller the noise level is, the smaller the error of stripe locating results is. The method has been used to estimate the experimental image, and the same conclusion can be obtained. The method can be used for recognizing large error data automatically by the two parameters.

关 键 词：locating LIGHT SKEWNESS 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术] O439[自动化与计算机技术—计算机科学与技术]