恒流驱动下基于V_(eE_max)的IGBT模块解耦老化影响的结温测量方法  

Junction Temperature Measurement Method of IGBT Modules Based on V_(eE-max) Under Constant-Current Source Drive Which Decouples Fatigue Effect

作　　者：杨舒萌 孙鹏菊[1] 王凯宏 王绪龙 黄旭[1] Yang Shumeng;Sun Pengju;Wang Kaihong;Wang Xulong;Huang Xu(State Key Laboratory of Power Transmission Equipment&System Security and New Technology Chongqing University,Chongqing,400044,China;Zhuzhou CRRC Times Semiconductor Co.Ltd,Zhuzhou,412001,China)

机构地区：[1]输配电装备及系统安全与新技术国家重点实验室(重庆大学),重庆400044 [2]株洲中车时代半导体有限公司,株洲412001

出　　处：《电工技术学报》2022年第12期3038-3047,3072,共11页Transactions of China Electrotechnical Society

基　　金：广东省重点领域研发计划资助项目(2020B010173001)。

摘　　要：绝缘栅双极型晶体管(IGBT)的结温在线测量对于电力电子装置的安全可靠运行、延长使用寿命和热管理等都具有重要意义。然而,目前大多数温敏电参数均受IGBT模块疲劳老化的影响。为此,该文提出一种恒流驱动下基于感应电压峰值V_(eE_max)的IGBT模块结温在线测量方法,该方法能够解耦键合线老化对温敏电参数的影响。基于双脉冲实验平台分析V_(eE_max)的温线性度和温敏感度,并通过模拟键合线老化实验验证所提方法的老化解耦性。最后,通过Buck变换器验证该方法在运行变流器中在线结温测量的可行性。Online junction temperature measurement of insulated gate bipolar transistors(IGBTs)is of great significance for safe and reliable operation,prolonging service life and thermal management of power electronic devices.However,most of the temperature sensitive electrical parameters(TSEPs)are coupled with the fatigue of IGBT modules.Therefore,this paper proposed a junction temperature measurement method based on the peak value of induced voltage V_(eE-max)under constant current source,which decouples the influence of the bond wire fatigue.This paper analyzed the temperature linearity and temperature sensitivity of V_(eE-max)based on dual pulse experimental platform,then verified the fatigue decoupling function of proposed method by simulating the bond wire fatigue.Finally,the feasibility of online junction temperature measurement is verified by Buck converter.

关 键 词：绝缘栅双极型晶体管(IGBT) 温敏电参数 解耦老化影响 结温在线测量 

分 类 号：TM46[电气工程—电器]