红外焦平面探测器杜瓦组件的热致破坏及其环境试验  

Thermal damage of infrared focal plane detector Dewar and its environmental test

作　　者：李建林[1] 刘卓林 陈晓燕 雷永畅 董伟[1] 钱昆伦 Li Jianlin;Liu Zhuolin;Chen Xiaoyan;Lei Yongchang;Dong Wei;Qian Kunlun(Kunming Institute of Physics,Kunming 650223,China;Mililary Representation Office of Equipment Department of China PLA Air Force in Kunming Area,Kunming 650223,China)

机构地区：[1]昆明物理研究所,云南昆明650223 [2]空军装备部驻昆明地区军事代表室,云南昆明650223

出　　处：《红外与激光工程》2022年第4期142-151,共10页Infrared and Laser Engineering

摘　　要：红外探测器的环境耐受能力取决于设计和制造中完整有效的环境耐受措施,环境试验与评价验证了其在极端环境作用下能正常工作的能力。研制、生产和使用各阶段的试验目的不同,试验施加应力的大小不同,必须进行环境自然条件和诱发条件测量、温度响应特性调查和试验环境分析,选择正确、合理和必要的设计与试验环境条件,以尽可能产生最适合的试验数据,保证顾客所需的质量水平和有价格竞争力的可用性。运用288×4红外焦平面杜瓦组件温度响应试验实测数据和时间常数方法,计算分析它的温度稳定时间,指出空气介质温度循环筛选或温度冲击试验,不能在红外探测器的功能部件上施加大于10℃/min的温度急剧变化应力,高温工作状态的温度变化速率大于50℃/min对冷头部分的缺陷筛选效果更好。试验结果表明,真空完好性恒定高温试验应力量值大于+90℃、2160 h。能够通过高温+71℃、低温-54℃无故障环境试验考核的产品具有全世界贮存、运输和使用的潜力。The environmental tolerance of infrared detectors depends on complete and effective environmental tolerance measures in design and manufacturing.The environmental test and evaluation of infrared detectors verify the ability to work normally in extreme environments.The purpose of the test at each stage of development,production and use is different,and the amount of stress applied by the test is different.It is necessary to measure the natural conditions and inducing conditions,and to analyse the investigation of temperature response characteristics and test environment.According to the measure and the analysis,to select the correct,reasonable and necessary design and test environmental conditions collect the most suitable test data as much as possible,to ensure the quality level required by customers and the availability of competitive prices.The temperature response test measured data of 288×4 infrared focal plane Dewar module and time constant method were used to calculate and analyze the temperature stabilization time.The results showed that,in the temperature cycles screening and erature shock test,a sudden temperature change stress greater than 10℃/min could not impose on the functional parts of the infrared detector,and the defect screening effect of the cold head part was better when the temperature change rate of the high temperature working state was greater than 50℃/min.The test results indicate that the stress for vacuum integrity is greater than+90℃for 2160 h in the vacuum integrity constant high temperature test.The products passed the failure-free environmental test assessment at high-temperature+71℃and low-temperature-54℃have the potential to be stored,transported and used all over the world.

关 键 词：环境适应性 可靠性 环境应力筛选 红外焦平面 杜瓦 

分 类 号：TN215[电子电信—物理电子学]