电感耦合等离子体发射光谱法测定铅精矿中的二氧化硅  

Determination of silicon dioxide in lead concentrate by inductively coupled plasma atomic emission spectrometry

作　　者：袁惠 Yuan Hui(Shaanxi Huatuo Technology Testing Co.,Ltd.,Baoji 721004,China)

机构地区：[1]陕西华拓检测科技有限公司,宝鸡721004

出　　处：《分析仪器》2022年第3期21-24,共4页Analytical Instrumentation

摘　　要：采用碱熔融-酸化方法处理试样,利用电感耦合等离子体发射光谱法(ICP-OES)测定铅精矿中的二氧化硅。主要分析了熔融剂的选择、熔融时间以及引入的基体元素钾、铅、锌、铜、铁、钙、镁、铝元素等对被测元素的干扰情况。结果表明,在一定范围内,基体干扰不存在影响,二氧化硅的方法检出限为0.045μg/mL,方法回收率在95%~102%,方法精密度(RSD,n=8)在2%左右,测定范围在0.045%~10%.本法操作方便,测试快捷,具有良好的精密度和准确度,可满足铅精矿中二氧化硅含量的测定。The samples were treated by alkali fusion-acidification method,and determined by ICP-OES.The selection of melting agent,melting time and the interference of matrix elements such as potassium,lead,zinc,copper,iron,calcium,magnesium and aluminum on the measured elements were analyzed.The results indicated that,within a certain range,the matrix interference had no effect,the determination limit of SiO;was0.045μg/mL,the recovery was 91%—117%,the method precision(RSD,n=8)was about 2%,and the content range was 0.045%—10%.The proposed method has the advantages of simple operation,short anaysis time,good precision and accuracy.

关 键 词：铅精矿 二氧化硅 电感耦合等离子体发射光谱法 

分 类 号：O657.31[理学—分析化学] TD926.3[理学—化学]