基于微电阻测量的开关导通耐久测试仪研究  

Research on Switch Conduction Durability Tester Based On Microresistance Measurement

作　　者：康凯 KANG Kai(Liaoning Institute of Science and Engineering,Jinzhou 121007,China)

机构地区：[1]辽宁理工学院,辽宁锦州121007

出　　处：《现代信息科技》2022年第5期50-52,56,共4页Modern Information Technology

摘　　要：文章对微电阻测量的开关导通耐久测试仪进行设计研究。为达到对微小电阻的精度测量,采用恒流源技术进行扩展,稳定地提取出信号;通过信号放大、信号采集及A/D转换显示结果。利用四线测量法,在测量导线电阻不相等的情况保证测量精度,四线法技术消除接触电阻,减少测量误差,提高测量精度;使用A/D转换方式将模拟信号转为数字信号,采用ICL7135转换器保证数据转换的可靠性和稳定性;使用STM32F103RBT6微控制器进行运算及后续通信传输处理,保证系统的稳定性和实时性。This paper designs and studies the switch conduction durability tester of microresistance measurement.To achieve the precision measurement of the microresistance,it uses continuous current source technology to expand,extracts the signal stably.Through signal amplification,signal acquisition and A/D conversion,the results are displayed.Using the four-line measurement method,it ensures the measurement accuracy when the measurement wire resistance is unequal.The four-line method technology eliminates the contact resistance,it can reduce the measurement error and improve the measurement accuracy.The analog signal is converted to digital signal by using the A/D conversion mode,and it uses the ICL7135 converter,to ensure the reliability and stability of the data transformation.It uses the STM32F103RBT6 microcontroller for the operation and subsequent communication transmission processing,which ensures the stability and real-time performance of the system.

关 键 词：微电阻 开关导通 高精度 

分 类 号：TP368[自动化与计算机技术—计算机系统结构]