93C56B耐久性试验方法研究  

Study on Durability Test Method of 93C56B

作　　者：苏琳 郎猛 SU Lin;LANG Meng(The 47th Institute of China Electronics Technology Group Corporation,Shenyang 110000,China)

机构地区：[1]中国电子科技集团公司第四十七研究所,沈阳110000

出　　处：《微处理机》2022年第3期34-37,共4页Microprocessors

摘　　要：为进一步挖掘EEPROM器件的应用潜力,以微芯片93C56B为例,设计一套针对存储数据耐久性的试验方法。从具体工艺需求入手,探讨万次擦写对存储器的耐久性与产品可靠性的意义。基于前期工作经验和成果,面向生产第一线,从硬件、软件两方面设计并实现一套具体的擦写器系统,并在使用中减少人工干预,提高工作效率,使操作简单、方便、直观。擦写器系统硬件体积小、软件界面友好、易操作,便于查错和批量作业,已在实际生产测试中得到良好应用,对于节约时间与人工成本效果明显。In order to further tap the application potential of EEPROM devices,taking microchip93C56B as an example,a set of test methods for the durability of stored data is designed.Starting from the specific technological requirements,the significance of 10000 times of erasing and writing to the durability of memory and the reliability of products is discussed.Based on the previous work experience and achievements,facing the front line of production,a set of specific eraser system is designed and implemented from two aspects of hardware and software.In use,manual intervention is reduced,work efficiency is improved,and operation is simple,convenient and intuitive.The eraser system has the advantages of small hardware volume,friendly software interface,easy operation,easy error checking and batch operation.It has been well applied in actual production test,and has obvious effect on saving time and labor cost.

关 键 词：EEPROM器件 93C56B型微芯片 数据擦写 数据校验 存储耐久性 

分 类 号：TN406[电子电信—微电子学与固体电子学]