微波组件测试系统安全性策略  

作　　者：孔令华[1] 陈兆国[1] 徐欣欢[1] 

机构地区：[1]南京电子技术研究所,江苏南京210039

出　　处：《数据》2022年第4期54-56,共3页DATA

摘　　要：微波组件测试系统具有自动控制、自动采集、数据处理等功能,可实现组件的高效率、高精度、多通道、全指标测量,是微波组件批量生产的重要模式。在测试系统的研制和使用过程中,存在一些常发故障,影响了测试系统的推广使用。本文系统重点阐述了测试系统的安全性设计原则、常见故障分类,并提出了相应安全性策略,进而提出了测试系统软、硬件的改进措施,并结合实际案例验证了改进措施的有效性。The microwave module test system has the functions of automatic control, automatic acquisition, data processing and so on. It can realize high-efficiency, high-precision, multi-channel and full index measurement of components. It is an important mode for batch production of microwave modules.During the development and application of the test system, there are some common faults, which affect the popularization and application of the test system. This paper focuses on the safety design principles and common fault classification of the test system, and puts forward the corresponding safety strategies, and then puts forward the improvement measures of the software and hardware of the test system, and verifies the effectiveness of the improvement measures with practical cases.

关 键 词：微波组件 测试系统 安全性策略 信号中枢 信号过载 

分 类 号：TP3[自动化与计算机技术—计算机科学与技术]