基于STM32F103ZET6的电路特性测试仪  

Circuit characteristic tester based on stm32f103zet6

作　　者：杨旻荟 田澄睿 顾浚哲 Yang Minhui;Tian Chengrui;Gu Junzhe(School of Electronics and Information Engineering,Nanjing University of Information Science and Technology,Nanjing Jiangsu,210044)

机构地区：[1]南京信息工程大学电子与信息工程学院,江苏南京210044

出　　处：《电子测试》2022年第12期25-27,83,共4页Electronic Test

摘　　要：本电路特性测试仪以单片机STM32F103ZET6为核心,来测量特定放大器电路的特性,包括输入输出电阻,放大倍数和增益,进而判断该放大器由于元器件变化而引起故障或变化的原因。本系统主要由模拟电路组成,由单片机作为控制核心,结合继电器实现换路测试。根据放大电路的等效定理,在放大器的输入输出电路中串入电阻并结合分压原理可测得输入输出电阻。放大倍数的测量则根据输出电压与输入电压的关系实现。本文设计的电路特性测试仪测量电阻与增益时相对误差均不超过10%,且可实时绘制幅频特性曲线并显示截止频率。This circuit characterisation tester uses the microcontroller STM32F103ZET6 as the core to measure the characteristics of a specific amplifier circuit,including input and output resistance,amplification and gain,and thus determine the cause of a fault or change in the amplifier due to component changes.The system consists mainly of an analogue circuit,with a microcontroller as the control core,combined with a relay to implement a circuit change test.According to the equivalence theorem for amplification circuits,the input and output resistances are measured by adding resistors to the input and output circuits of the amplifier and the voltage division principle.The measurement of the amplification is then based on the relationship between the output voltage and the input voltage.The circuit characteristics tester is designed to measure resistance and gain with a relative error of no more than 10%while plotting the amplitude-frequency curve in real time and displaying the cut-off frequency.

关 键 词：射频衰减 直流检波 幅频特性 程控放大 

分 类 号：TP216[自动化与计算机技术—检测技术与自动化装置]