铁水X射线荧光光谱微量元素测定的干扰校正探讨  

Determination of trace elements in raw iron by X-ray fluorescence spectrometry discussion on interference correction

作　　者：褚永俊 CHU Yongjun(Manufacturing Management Department,Baoshan Iron & Steel Co. ,Ltd., Shanghai 201900, China)

机构地区：[1]宝山钢铁股份有限公司制造管理部,上海201900

出　　处：《宝钢技术》2022年第2期37-40,共4页Baosteel Technology

摘　　要：研究了应用X射线荧光光谱仪测定生铁样品中微量元素时干扰校正问题。采用高炉铁水标准样品建立工作曲线。研究应用岛津MXF-2400荧光仪软件的dj方法消除分析元素间干扰,同时研究了用高炉铁水生产样品对工作曲线进行校正,荧光分析结果与化学分析值一致性较好。This paper studies the interference correction in the determination of trace elements in pig iron samples by X-ray fluorescence spectrometer.The working curve is established by using the standard sample of blast furnace molten iron.The dj method of Shimadzu MXF-2400 fluorometer software is studied to eliminate the interference between analytical elements.At the same time,the correction of the working curve with blast furnace molten iron production samples is studied,and the results of fluorescence analysis are in good agreement with those of chemical analysis.

关 键 词：XRF 生铁 干扰校正 

分 类 号：O657.34[理学—分析化学]