国产小型磁选态铯钟电子倍增器性能测试与分析  

Performance characterization and analysis of electron multiplier for home-made compact magnetically selected cesium atomic clock

作　　者：郭磊[1,2] 陈江 王多书[1,2] 王骥 黄良玉[1,2] 马寅光 崔敬忠[1,2] 刘志栋 杨纬 侍椿科[1] 李富乾 杨军[1,2] 郑宁 GUO Lei;CHEN Jiang;WANG Duo-shu;WANG Ji;HUANG Liang-yu;MA Yin-guang;CUI Jing-zhong;LIU Zhi-dong;YANG Wei;SHI Chun-ke;LI Fu-qian;YANG Jun;ZHENG Ning(Lanzhou Institute of Physics,Lanzhou 730000,China;Science and Technology on Vacuum Technology and Physics Laboratory,Lanzhou 730000,China)

机构地区：[1]兰州空间技术物理研究所,兰州730000 [2]真空技术与物理重点实验室,兰州730000

出　　处：《时间频率学报》2022年第2期143-150,共8页Journal of Time and Frequency

基　　金：国防重点实验室基金资助项目(HTKJ2020KL510006)。

摘　　要：采用电子入射测试系统测试了目前国产小型磁选态铯钟电子倍增器的性能,相比国内敏化法与早期磁控溅射法,目前磁控溅射法研制电子倍增器增益提高了4倍,二次电子发射系数由4.6提高至5.4,暗电流指标降至0.5 pA以下,衰减速率由2 V/d降至0.1〜0.7 V/d,使用寿命由2年提高至5年以上,部分可达20年。相比美国研制电子倍增器性能,增益与二次电子发射系数已接近,暗电流已达到,衰减速率还存在差距,具体表现不同器件衰减速率离散性更大。在后续的研究工作中,还需要继续降低电子倍增器的衰减速率,提高不同器件一致性。The electron incidence testing system was used to characterize the performance of electron multiplier used by home-made compact magnetically selected cesium atomic clock.Compared with domestic Ag-Mg Alloy activated method and magnetron sputtering method in the early process, at present the gain of the electron multiplier made by magnetron sputtering method has increased by 4 times, secondary electron emission coefficient have increased from 4.6 to 5.4,dark current has fallen to 0.5 pA,and decay rate has fallen from 2 V/day to 0.1~0.7 V/day, service lifetime can be more than 5 years, some up to 20 years.Compared with the technical performance of electron multiplier made in USA,gain and secondary electron emission coefficient and dark current are comparable, and there is still a big gap in the decay rate, as indicated by the divergence in the various parts.It is necessary to reduce decay rate and control the process fluctuation in the following research.

关 键 词：国产磁选态铯钟 电子倍增器 磁控溅射技术 

分 类 号：TN03[电子电信—物理电子学] TH714.14[机械工程—测试计量技术及仪器]