电子元器件气候试验的检测方法探讨  

Discussion on the Detection Method of Climate Test of Electronic Components

作　　者：闫萌 Yan Meng(The 13th Research Institute,CETC,Hebei Shijiazhuang 050051;National semiconductor device quality inspection and Testing Center,Hebei Shijiazhuang 050051)

机构地区：[1]中国电子科技集团公司第十三研究所,河北石家庄050051 [2]国家半导体器件质量检验检测中心,河北石家庄050051

出　　处：《电子质量》2022年第6期14-17,共4页Electronics Quality

摘　　要：电子元器件是电子产品的重要组成部分,是实现电子产品功能的重要组成部分。在电子产品行业中,对电子元器件的质量要求比较高。但是在实际应用过程中,电子元器件受各种环境因素的影响其性能会有所变化。因此需对电子元器件进行各种环境试验的筛选,剔除可靠性差的部分。Electronic components are an important part of electronic products and an important part of realizing the functions of electronic products.In the electronic product industry,the quality requirements for electronic components are relatively high.However,in the process of practical application,the performance of electronic components will change due to various environmental factors.Therefore,it is necessary to screen various envi ronmental tests on electronic components and eliminate the parts with poor reliability.

关 键 词：电子元器件 检测方法 气候试验 

分 类 号：TN606[电子电信—电路与系统]