NiFe-YIG颗粒膜中铁磁共振线宽的角度依赖性  

Angle dependence of ferromagnetic resonance in NiFe-YIG granular films

作　　者：韩莹 郑博含 钟智勇[1] HAN Ying;ZHENG Bohan;ZHONG Zhiiyong(State Key Laboratory of Electric Thin Films and Integrated Devices, University ofElectronic Science and Technology of China, Chengdu 610054, China)

机构地区：[1]电子科技大学电子薄膜与集成器件国家重点实验室,成都610054

出　　处：《功能材料》2022年第6期6130-6136,共7页Journal of Functional Materials

基　　金：国家自然科学基金项目(62171079)。

摘　　要：给出了镍铁合金-钇铁石榴石(NiFe-YIG)颗粒薄膜铁磁共振的测量结果,目的是研究薄膜内部线宽展宽机制。通过射频磁控溅射法在硅衬底上制备了50 nm厚度的NiFe-YIG颗粒薄膜样品,主要进行了面外转角铁磁共振测试,结合吉尔伯特阻尼、双磁子散射(短程缺陷激发)和镶嵌效应(长程缺陷激发)的理论对线宽进行分离;可以发现,线宽和场角的数据与理论相符合。当YIG含量较低时,线宽主要由吉尔伯特阻尼和双磁子散射阻尼线宽组成;随着YIG含量增大,双磁子散射和镶嵌效应导致的线宽展宽效应随之增大,并且获得了有关基本参数及缺陷信息。In this thesis,the measurement results of ferromagnetic resonance of nickel iron alloy yttrium iron garnet(NiFe-YIG)granular thin films are given in order to study the mechanism of linewidth broadening in the films.The 50 nm thickness of NiFe-YIG granular thin films was prepared by RF magnetron sputtering on silicon subtrate.The out of plane angle ferromagnetic resonance was mainly measured.The linewidth was separated by combining the theories of Gilbert damping,two-magnon scattering(short-range defect excitation)and mosaic effect(long-range defect excitation).It can be found that data of linewidth and field angle are consistent with the theory.When the YIG content is low,the linewidth is mainly composed of Gilbert damping and two-magnon damping linewidth.With the increase of YIG content,the linewidth broadening effect caused by two-magnon scattering and mosaic effect increases,and the relevant basic parameters and defect information are obtained.

关 键 词：颗粒膜 铁磁共振 吉尔伯特阻尼 双磁子散射 镶嵌效应 

分 类 号：O482.5[理学—固体物理]