载荷探测器像元满阱参数测试  

Measurement of pixel full-well parameters of detector used on spaceborne spectrometer

作　　者：常振 王煜[1] 林方 赵欣[1] 黄书华 司福祺[1] CHANG Zhen;WANG Yu;LIN Fang;ZHAO Xin;HUANG Shujua;SI Fuqi(Key Laboratory of Environmental Optical and Technology,Anhui Institute of Optics and Fine Mechanics,Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei 230031,China;Information Materials and Intelligent Sensing Laboratory of Anhui Province,Institutes of Physical Science and Information Technology,Anhui University,Hefei 230039,China)

机构地区：[1]中国科学院,合肥物质科学研究院,安徽光学精密机械研究所,环境光学与技术重点实验室,安徽合肥230031 [2]安徽大学物质科学与信息技术研究院,信息材料与智能感知安徽省实验室,安徽合肥230039

出　　处：《光学精密工程》2022年第13期1542-1554,共13页Optics and Precision Engineering

基　　金：国家自然科学基金青年科学基金资助项目(No.61905256)。

摘　　要：在CCD成像电路的研发过程中,为了确保CCD达到最优的满阱性能,需要不断调整CCD驱动信号参数并进行满阱测试,该过程通常需要重复几十甚至上百次。通用的光子转移曲线法需要积分球等设备搭建平场光源,系统复杂,满阱测试效率较低。提出了一种满阱测试方法——LED点测试法,该方法通过光子转移曲线法获取系统增益后,仅通过搭建LED点光源配合普通民品镜头即可实现CCD满阱测试。基于载荷CCD成像电路,使用LED点测试法进行测试。结果表明,载荷CCD的满阱电子数可达817.013ke^(-),误差不大于0.643%。针对LED点测试的同组数据采用传统满阱测试方法进行测试,对比结果表明,LED点测试法和传统测试方法相对光子转移曲线法的误差分别为0.0397%和1.9%。LED点测试法可用作简易条件下快速测量CCD满阱的通用方法,能够提升CCD成像电路的研发效率。During the development of a charge-coupled device(CCD)imaging circuit,it is necessary to adjust the parameters of the CCD’s driving signal and repeatedly test the full-well parameters dozens or even hundreds of times to ensure the optimal full-well performance of the CCD.To achieve this,the gen⁃eral method employed,known as the photon transfer curve method,requires integrating a sphere and other equipment to create a flat-field light source system.However,the resulting system is complex,and hence,it is unsuitable for application in a full-well testing method during the development of an imaging system.In this paper,a novel full-well testing method,a light-emitting diode(LED)point test method,is proposed.Accordingly,CCD full-well testing can be easily realized by developing an LED point light source and common civilian lens.The results reveal that the number of full-well electrons of a spaceborne CCD can reach 817.013ke-,and the error can be less than 0.643%.The results also indicate that the er⁃rors resulting from the LED point test method and the traditional method are,respectively,0.0397%and 1.9%compared with the errors resulting from the photon transfer curve method.In summary,the LED point test method can be used as a general method to rapidly measure the full-well parameters of a CCD un⁃der simple conditions,and it can enhance the efficiency of CCD imaging circuit development.

关 键 词：电荷耦合器件 满阱容量 光子转移曲线 LED点测试法 数据拟合 

分 类 号：TP73[自动化与计算机技术—检测技术与自动化装置] TN386.5[自动化与计算机技术—控制科学与工程]