SiC_(p)/Al切削精确测温前红外热像仪发射率标定的实验研究  

Experimental study on emissivity setting before precise temperature measurement of SiC_(p)/Al cutting by infrared thermal imager

作　　者：张淇 李国和[1] 孙勇 孙飞 Zhang Qi;Li Guohe;Sun Yong;Sun Fei(Mechanical Department,Tianjin University of Technology&Education,Tianjin 300222,China)

机构地区：[1]天津职业技术师范大学机械工程学院,天津300222

出　　处：《红外与激光工程》2022年第6期169-178,共10页Infrared and Laser Engineering

基　　金：国家自然科学基金(51875409);天津市教委重点项目(2020ZD08);天津市“项目+团队”重点培养专项(XC202051)。

摘　　要：发射率设定对红外热像仪测量结果的准确性具有决定性的影响,必须在测温前进行准确标定。首先通过热电偶标定试验研究了发射率设定对红外热像仪测温精度的影响。其次通过析因实验分析了设定发射率的影响因素。最后通过正交实验研究了各因素对设定发射率的影响程度,并进行了经验公式拟合和实验验证。结果表明:对于SiC_(p)/Al复合材料,设定发射率在被测温度500℃前后有很大的差异,被测温度超过500℃时,采用推荐值作为设定方法则会产生较大误差。在[0°,45°]范围内测量角度对设定发射率几乎没有影响,但温度、表面粗糙度和观测距离都会影响设定发射率。多项式拟合获得的设定发射率经验公式预测结果的最大误差为2.76%。Emissivity setting has a decisive impact on the accuracy of the measurement results of infrared thermal imager, so it must be calibrated accurately before temperature measurement. In this paper, the influence of emissivity setting on temperature measurement accuracy of infrared thermal imager was studied through thermocouple calibration test. Secondly, the influence factors of emissivity setting were analyzed by factorial experiment. Finally, the influence degree of each factor on the emissivity setting was studied by orthogonal experiment, and the empirical formula fitting and experimental verification were carried out. The results show that: for SiC_(p)/Al composites, the emissivity setting is very different before and after the measured temperature is500 ℃. When the measured temperature exceeds 500 ℃, using the recommended value as the setting method will produce large errors. In the range of 0°-45°, the measurement angle has no influence on the emissivity setting.However, temperature, surface roughness and observation distance all affect the emissivity setting. The maximum error of the empirical formula of the emissivity setting obtained by polynomial fitting is 2.76%.

关 键 词：切削温度 红外热像仪 发射率设定 影响因素 经验公式 

分 类 号：TN219[电子电信—物理电子学]