A new LFSR based high-frequency test method for RSFQ circuit  

作　　者：Liyun Chen Songrui Li Liliang Ying Minghui Niu Huanli Liu Hui Zhang Xue Zhang Xiaoping Gao Jie Ren Wei Peng Zhen Wang 

机构地区：[1]State Key Laboratory of Functional Material for Informatics,Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences,Shanghai 200050,China [2]CAS Center for Excellence in Superconducting Electronics(CENSE),Shanghai 200050,China [3]University of Chinese Academy of Sciences,Beijing 100049,China

出　　处：《Superconductivity》2022年第2期23-27,共5页超导（英文）

基　　金：supported by the National Natural Science Foundation of China under Grant No.92164101;the National Natural Science Foundation of China under Grant No.62171437;the Strategic Priority Research Program of the Chinese Academy of Sciences under Grant No.XDA18000000;Shanghai Science and Technology Committee(Grant No.21DZ1101000);the National Key R&D Program of China under Grant No.2021YFB0300400.

摘　　要：Rapid single flux quantum(RSFQ)circuits have the advantages of high speed and low power consumption.The typical frequency of the RSFQ circuits is tens of GHz.Therefore,it is necessary to reliably test the highfrequency performance of RSFQ circuits simply and effectively.This paper proposes a new on-chip highfrequency testing method,which uses pseudo-random sequences generated by linear feedback shift register(LFSR)as the test vectors,and the output shift registers(SRs)to store the last piece of high-frequency testing result and read out it at low-frequency.Unlike the traditional high-frequency demonstration method of using the Input/Output SRs,our testing system can automatically generate a large number of test vectors to test the circuit at high frequency at low cost,making the whole high-frequency demonstration more reliable and convincing.On the other hand,this method is also a feasible and straightforward on-chip high-frequency test method for various RSFQ circuits.This work verified the proposed method,and the highest test frequency can reach 54 GHz while the circuit shows good operating margins.

关 键 词：LFSR SFQ High-frequency testing On-chip testing system 

分 类 号：TN9[电子电信—信息与通信工程]