超低亮度测量技术研究  

Study on measurement technology of ultra-low brightness

作　　者：孙宇楠[1] 曹锋[1] 赵俊成 刘瑞星[1] 王乐[1] 高婧[1] 杨科 SUN Yu'nan;CAO Feng;ZHAO Juncheng;LIU Ruixing;WANG Le;GAO Jing;YANG Ke(The First Scale Optical Metrology Station of the Science,Technology and Industry for National Defense,Xi'an Institute of Applied Optics,Xi'an 710065,China)

机构地区：[1]西安应用光学研究所国防科技工业光学一级计量站,陕西西安710065

出　　处：《应用光学》2022年第4期701-706,共6页Journal of Applied Optics

基　　金：国防科技工业技术基础科研计划(JSJL2019208D001)。

摘　　要：光亮度是表征发光体的重要光度特性参数。提出了一种超低亮度计的设计方法,描述了超低亮度计的工作原理和组成;利用微弱光信号处理技术、非线性校准技术、制冷散热技术等实现了超低亮度的自动测量;根据亮度计的测量原理,对仪器进行了标定,测量不确定度达到5%。超低亮度计可适用于实验室和现场等测试场所,为微光夜视装备、显示系统、特种光源、发光材料等的性能评估测试和校准提供计量保障。The brightness is an important parameter of photometric characteristics to characterize the luminescent materials.A design method of ultra-low brightness meter was proposed,and the working principle and composition of the device were described.The automatic measurement of ultra-low brightness was realized by using the technologies of weak light signal processing,nonlinear calibration,cooling and heat dissipation.According to the principle of brightness meter measurement,the calibration was carried out,and the uncertainty of measurement was up to 5%.The ultra-low brightness meter can be used in testing sites such as laboratory and field,which can provide metrological guarantee for performance evaluation and calibration of low-level-light night vision equipment,display system,special light source and luminescent materials.

关 键 词：光亮度 超低亮度计 标定 制冷散热技术 测量不确定度 

分 类 号：TN206[电子电信—物理电子学]