“K”反射系数法在低电阻率地质背景下的应用研究  

Application of"K"Reflection Coefficient Method in Low Resistivity Geological Background

作　　者：邬健强 刘磊 洪旭程 刘道涵 刘永亮 WU Jian-Qiang;LIU Lei;HONG Xu-Cheng;LIU Dao-Han;LIU Yong-Liang(Wuhan Center of Geological Survey(Central South China Innovation Center for Geosciences),Wuhan 430205,Hubei,China;Zhejiang Engineering Geophysical Prospecting and Design Institute Co.,Ltd,Hangzhou 310000,Zhejian,China;Institute of Karst Geology,GAGS,Guilin 541004,Guangxi,China)

机构地区：[1]中国地质调查局武汉地质调查中心(中南地质科技创新中心),湖北武汉430205 [2]浙江省工程物探勘察设计院有限公司,浙江杭州310000 [3]中国地质科学院岩溶地质研究所,广西桂林541004

出　　处：《华南地质》2022年第2期312-320,共9页South China Geology

基　　金：中国地质调查局项目(DD20221634,DD20221755);国家自然科学基金(42107485)。

摘　　要：高密度电阻率法因其成本低、效率高等优点而被广泛应用,而对于低电阻率地质背景的区域,如白垩系粉砂岩分布区,其效果并不理想甚至无法分辨有效异常。基于此,笔者通过两个不同地质背景的实例,将高密度电阻率法的结果与通过“K”反射系数法处理后的结果进行了对比应用研究,研究结果表明:(1)相比视电阻率剖面图,“K”反射系数法得到的“K”剖面图能够有效的放大深部地质弱信号,突出局部异常,且异常位置与钻孔结果对应良好;(2)相比钻孔处的单支视电阻率测深曲线,“K”反射系数法得到的单支“K”曲线对地下的解释更加精细,分辨率更高。High density resistivity method is widely used because of its low cost and high efficiency.For areas with low resistivity of large background,such as Cretaceous siltstone,it is found that the effect is not satisfactory,even the effective anomalies cannot be distinguished on some occasion.Based on this,this study compares the results of high-density resistivity method with those processed by“K”reflection coefficient method through two examples with different geological backgrounds.The results show that,(1)Comparing with the apparent resistivity profile,the“K”profile obtained by the“K”reflection coefficient method can effectively amplify the deep geological weak signal and highlight local anomalies,and the gained abnormal location corresponds well with the drilling results;(2)Compared with the single apparent resistivity sounding curve at the drill hole,the single“K”curve obtained by the“K”reflection coefficient method provides finer interpretation and higher resolution.

关 键 词：“K”反射系数法 视电阻率剖面图 单支视电阻率测深曲线 单支“K”曲线 “K”剖面 

分 类 号：P631[天文地球—地质矿产勘探]