近红外波段高精度BRDF测量系统研究  

High-Precision BRDF Measurement System in Near Infrared Band

作　　者：李卓然 李雨霄 刘子龙[1] Li Zhuoran;Li Yuxiao;Liu Zilong(Division of Optical Metrology,National Institute of Metrology,Beijing 100029,China)

机构地区：[1]中国计量科学研究院光学所,北京100029

出　　处：《光学学报》2022年第12期169-176,共8页Acta Optica Sinica

基　　金：国家自然科学基金(61875180);国家重点研发计划(2017YFF0205103)。

摘　　要：近红外波段的双向反射分布函数(BRDF)能够有效表征材料的反射特性,广泛应用于计算机建模、遥感、航天等领域。为了高精度测量近红外波段的BRDF值,研制了一套近红外波段的BRDF测量系统,提出了基于等面积亮度的单次绝对测量方案。该测量系统以被测样品中心为基点对测量系统的空间坐标系进行重新建模,使用六轴机械臂作为变角装置实现建模,能够无死角地改变样品的三维空间朝向,可以在2π半球空间内测量任意角度组合的材料BRDF值,该测量方案高精度测量了覆盖1000~3000 nm近红外波段的材料BRDF值。使用该系统对标准漫反射金板的BRDF值进行测量,结果表明测量结果的相对不确定度为1.5%,说明所研制的系统实现了高精度测量。Bidirectional reflection distribution function(BRDF)in near infrared band can effectively characterize the reflection properties of materials and is widely used in computer modeling,remote sensing,aerospace,and other fields.In order to measure the BRDF value of near infrared band with high precision,a near infrared band BRDF measurement system is developed,and an absolute measurement scheme based on equal area luminance is proposed.The measurement system takes the center of the tested sample as the base point to re-model the spatial coordinate system of the measurement system,and uses the six-axis manipulator as the angle-changing device to realize the modeling,which can change the three-dimensional orientation of the sample without blind angles.The BRDF values of materials with any angle combination can be measured in 2πhemispheric space.The BRDF values of materials covering the near infrared band of 1000 nm to 3000 nm are measured with high precision.The system is used to measure the BRDF value of the standard diffuse reflection gold plate,and the results show that the relative uncertainty of the measurement result is 1.5%,indicating that the developed system has achieved high-precision measurement.

关 键 词：测量 双向反射分布函数 绝对测量 近红外 不确定度 散射 

分 类 号：O439[机械工程—光学工程]