Bench test of interferometer measurement for the Keda Reconnection eXperiment device(KRX)  

作　　者：Dongkuan LIU Weixing DING Wenzhe MAO Qiaofeng ZHANG Longlong SANG Quanming LU Jinlin XIE 刘东宽;丁卫星;毛文哲;张乔枫;桑龙龙;陆全明;谢锦林(CAS Key Lab of Geoscience Environment,School of Earth and Space Sciences,University of Science and Technology of China,Hefei 230026,People's Republic of China;Department of Plasma Physics and Nuclear Engineering,University of Science and Technology of China,Hefei 230026,People's Republic of China)

机构地区：[1]CAS Key Lab of Geoscience Environment,School of Earth and Space Sciences,University of Science and Technology of China,Hefei 230026,People's Republic of China [2]Department of Plasma Physics and Nuclear Engineering,University of Science and Technology of China,Hefei 230026,People's Republic of China

出　　处：《Plasma Science and Technology》2022年第6期32-37,共6页等离子体科学和技术（英文版）

基　　金：National Natural Science Foundation of China(No.11975231)。

摘　　要：Motivated by the need of the electron density measurement for the Keda Reconnection eXperiment(KRX)facility which is under development,an interferometer system has been designed and tested in bench.The 320 GHz solid-state microwave source with 1 mm wavelength is used to fulfill the high phase difference measurement in such low temperature plasma device.The results of the bench test show that the phase difference is accurately measured.In contrast to tens of degrees of phase shift expected to be measured on the KRX,the system noise(~1°)is low enough for the KRX diagnostics.In order to optimize the system for better performance,we utilize the Terasense sub-THz imaging system to adjust alignment.The interferometer system has also been calibrated via changing of the optical path length controlled by the piezo inertial motor.Simultaneously,high density polyethylene thin film is introduced successfully to change a tiny phase difference and test the sensitivity of the interferometer system.

关 键 词：magnetic reconnection DIAGNOSTICS INTERFEROMETER 

分 类 号：O53[理学—等离子体物理]