X射线荧光光谱无铬钝化膜测厚法在镀锌机组中的应用  

APPLICATION OF XRF NON-CHROMATE PASSIVATION FILM THICKNESS MEASUREMENT METHOD IN GALVANIZING LINE

作　　者：焦政华 冯茜彦 范志永[1] 王振宇 邢巍 Jiao Zhenghua;Feng Xiyan;Fan Zhiyong;Wang Zhenyu;Xing Wei(Anyang Iron and Steel Group Co.,Ltd)

机构地区：[1]安阳钢铁集团有限责任公司 [2]安阳钢铁集团有限责任公司质量检测处,河南安阳455004

出　　处：《河南冶金》2022年第1期40-43,共4页Henan Metallurgy

摘　　要：介绍了镀锌机组涂镀设备,检化验制样设备、实验仪器的配置情况,探索了采用称重法确定无铬钝化层膜厚标准值[1]的方法,提出了将无铬钝化液按不同厚度涂镀到镀锌基板表面,在X射线荧光光谱仪上,建立标准曲线,进行线性回归,通过检测无铬钝化液中有机硅的含量,进而计算出单位面积内无铬钝化层膜厚的重量。在确保数据具有良好检测精度的前提下,该方法在镀锌机组中得到了广泛的应用。This paper briefly introduces the configuration of coating equipment,sample preparation equipment and experimental instruments for galvanizing line,and probes into the method of determining the standard value[1]of chromate-free passivation film thickness by weighing method,in this paper,the chromate-free passivation solution was coated on the surface of zinc plating substrate with different thickness,the standard curve was established and linear regression was carried out on the X-ray fluorescence spectrometer,and the organic silicon content in chromate-free passivation solution was determined,then the mass of chromate-free passivation film thickness per unit area is calculated.This method has been widely used in galvanizing line on the premise of ensuring good detection accuracy of data.

关 键 词：X射线荧光光谱 镀锌基板 无铬钝化层膜厚 

分 类 号：TG174.4[金属学及工艺—金属表面处理] O657.34[金属学及工艺—金属学]