基于线性生成图编码SoC测试向量方法  

Test Vector Method by Encoding SoC Based on Linear Generation Graph

作　　者：黄贵林 张正金 江家宝 吴其林 王洪海 HUANG Gui-lin;ZHANG Zheng-jin;JIANG Jia-bao;WU Qi-lin;WANG Hong-hai(School of Information Engineering,Chaohu University,ChaohU238024,Anhui Province,China)

机构地区：[1]巢湖学院信息工程学院,安徽巢湖238024

出　　处：《景德镇学院学报》2022年第3期32-36,共5页Journal of JingDeZhen University

基　　金：安徽省高校自然科学研究项目(KJ2021A1030);巢湖学院学科建设质量提升工程立项建设项目(kj21gczx03)。

摘　　要：为解决芯片集成度提高带来的自动测试设备(ATE)存储容量和带宽之间的矛盾,提出一种利用循环扫描链的测试数据压缩解压算法。移动循环扫描链中的测试向量,前后测试向量之间因此产生间接相容的关系,编码间接相容测试向量,实现测试数据压缩的目的。根据线性生成图,测试向量以最小幅度循环右移快速产生后续测试向量,有效降低测试应用时间。与同类经典方案相比,该方案的平均压缩率效果最好,编码算法简单,测试向量解码电路简单。Absrtact:In order to resolve the contradiction between the storage capacity and bandwidth of automatic test equipment(ATE) caused by the improvement of chip integration, a test data compression and decompression algorithm using cyclic scan chain is proposed.We move the test vectors in the cyclic scan chain, thus generating an indirect compatible relationship between the front and back test vectors.The indirect compatible test vectors are encoded to achieve the purpose of test data compression. According to the linear generation graph, the test vector is shifted to the right circularly with the minimum amplitude to quickly generate subsequent test vectors, effectively reducing the test Application time.Compared with similar classical schemes, this scheme has the best average compression rate, simple coding algorithm and simple test vector decoding circuit.

关 键 词：循环扫描链 测试向量 编码 

分 类 号：TN407[电子电信—微电子学与固体电子学]