国产超大规模集成电路测试系统综合试验验证方法  

Comprehensive Test Validation Method of Domestic Very-large-scale Integration Test System

作　　者：闫丽琴[1] 冯建呈[1] 王占选 殷晔[1] 刘莹 李小龙 YAN Liqin;FENG Jiancheng;WANG Zhanxuan;YIN Ye;LIU Ying;LI Xiaolong(Beijing Aerospace Measurement&Control Technology Co.,Ltd.,Beijing 100041,China;Beijing Microelectronics Technology Institute,Beijing 100076,China)

机构地区：[1]北京航天测控技术有限公司,北京100041 [2]北京微电子技术研究所,北京100076

出　　处：《计算机测量与控制》2022年第8期277-282,共6页Computer Measurement &Control

摘　　要：为全面验证国产超大规模集成电路测试系统的工作指标和性能,提出测试系统的一种综合试验验证方法,根据测试系统不同的验证阶段,分别从系统仪器技术指标测试试验验证、系统软硬件功能测试试验验证和系统集成电路测试能力试验验证3个阶段开展综合试验,并针对各阶段的验证方法开展测试系统的试验验证实例分析,验证实例结果表明该综合试验验证方法能够全方位验证国产超大规模集成电路测试系统的工作指标、功能性能以及测试能力,进一步验证所述方法的可行性;该验证方法能够有效解决集成电路测试系统投入测试应用前的试验验证问题,也为新研集成电路测试系统的指标与功能性能验证提供一种有效的综合验证思路。In order to fully verify the indicators and performance of the domestic Very-large-scale integration(VLSI)test system,a comprehensive test validation method of the test system is put forward.Depending on the verification phase of the test system,some methods are respectively researched from the system test and verification of test instruments indicators,hardware and software function and integrated circuit test capability.Aiming at each stage verification method,the test verification example analysis is carried to the test system.The test results show that the method can verify the indicators,functional performance and test ability in the domestic VLSI test system,and the feasibility of the method is further verified;This method can effectively solve the test verification problem in the IC test system before the test system is put into the application.An effective test verification idea is also provided for the indicators and performance of the new IC test system.

关 键 词：国产超大规模集成电路测试系统 综合试验验证方法 技术指标测试 软硬件功能测试 测试能力试验验证 

分 类 号：TP27[自动化与计算机技术—检测技术与自动化装置]