基于老化特征化提取进行时序分析的解决方案  

Solution to aging timing analysis based on aging characterization

作　　者：陈寒 宋存彪 吴韦忠 Chen Han;Song Cunbiao;Wu Weizhong(SANECHIPS Technology Co.,Ltd.,Backend Design Dept.FoundationIP,Shanghai 200120,China)

机构地区：[1]中兴微电子技术有限公司,后端设计部FoundationIP,上海200120

出　　处：《电子技术应用》2022年第8期51-54,59,共5页Application of Electronic Technique

摘　　要：基于Cadence的Liberate+Tempus解决方案,采用一种先进的标准单元老化特征化的方法,同时考虑了偏置温度不稳定性(Bias Temperatrure Instability,BTI)和热载流子注入(Hot Carrier Injection,HCI)老化效应,得到标准单元老化时序库,用于Tempus进行考虑老化的静态时序分析(Aging-aware Static Timing Analysis,Aging-aware STA)。产生一套先进的标准单元老化时序库,能够针对不同标准单元不同传输路径,表征一定范围的老化应力条件的时序特征,改善了传统添加全局时序减免值导致电路PPA(Performance/Power/Area)难以收敛的问题,同时只需要调用一套标准单元库也使STA更加简洁易操作。In this paper,an aging standard cell library considering both BTI(Bias Temperatrure Instability)and HCI(Hot Carrier Injection)is obtained by an advanced characterization method based on Cadence Liberate+Tempus solution,which can be used by Tempus to perform Aging-aware Static Timing Analysis(Aging-aware STA).Compared to setting a flat derate to the circuit,the aging library indicates the timing information of a certain range of aging stress conditions for different arcs of different cells,which optimizes PPA(Performance/Power/Area)of the circuit.In addition,only one library is invoked making STA simpler and easier to operate.

关 键 词：老化标准单元库 Cadence Liberate Aging Aware STA Tempus 

分 类 号：TN402[电子电信—微电子学与固体电子学]