辐射发射全电波暗室测试方法分析  

Analysis of Radiation Emission Full-Anechoic Room Test Method

作　　者：张峰[1] 戚露兴 吴淑忠 ZHANG Feng;QI Luxing;WU Shuzhong(ZTE Corporation,Shenzhen 201203,China)

机构地区：[1]中兴通讯股份有限公司,广东深圳201203

出　　处：《电子产品可靠性与环境试验》2022年第4期101-106,共6页Electronic Product Reliability and Environmental Testing

摘　　要：目前进行辐射发射测试的低频(30 MHz~1 GHz)部分主要在半电波暗室中进行,而进行1 GHz以上的高频辐射发射测试时,还需要人工在半电波暗室地面上铺设吸波材料,这中间的搬移不仅会耗费人力,延长测试时间,而且极易造成吸波材料的损坏。若是能在全电波暗室中实现全频段的辐射发射测试,不仅能够缓解半电波暗室的测试压力,而且可以有效地缩短测试时间,避免人工搬移吸波材料造成的损耗。通过分析标准中对于在全电波暗室中进行辐射发射测试的详细要求,并通过实测比对验证,总结出了全电波暗室辐射发射的测试方法。At present,the low frequency(30 MHz~1 GHz)part of the radiation emission test is mainly carried out in a Semi Anechoic Chamber(SAC),and when the high-frequency radiation emission test above 1 GHz is carried out,it is necessary to manually lay the absorbing material on the floor of the SAC.This movement not only consumes manpower and prolongs the test time,but also easily damages the absorbing material.If the full-frequency radiation emission test can be realized in a full anechoic room(FAR),not only the test pressure of the SAC can be relieved,but also the test time can be effectively shortened,and the loss caused by manual removal of absorbing materials can be avoided.By analyzing the detailed requirements for the radiation emission test in the FAR in the standard,and through the comparison and verification of the actual measurement,the test method of the radiation emission in FAR is summarized.

关 键 词：辐射发射 全电波暗室 半电波暗室 电磁兼容性 标准 

分 类 号：TN06[电子电信—物理电子学]