基于LabVIEW的LED模拟工况寿命试验系统设计  

Design of LED Simulation Working Condition Life Test System Based on LabVIEW

作　　者：吴杜雄 刘秀娟[2] 周钢 WU Duxiong;LIU Xiujuan;ZHOU Gang(CESI(Guangzhou)Standards&Testing Institute Co.,Ltd.Guangzhou 510700,China;China Electronics Standardization Institute,Beijing 100007,China;Shenzhen CESI Information Technology Co.,Ltd.Shenzhen 518057,China)

机构地区：[1]广州赛西标准检测研究院有限公司,广东广州510700 [2]中国电子技术标准化研究院,北京100007 [3]深圳赛西信息技术有限公司,广东深圳518057

出　　处：《自动化与信息工程》2022年第4期26-31,共6页Automation & Information Engineering

摘　　要：可靠性寿命评估是LED产业发展过程中亟需解决的问题。设计一套模拟LED实际工作温度、电流、电压条件的寿命试验系统,实现恒温加速寿命试验的实时监控、测量、保存数据等功能。通过相关试验及评估不确定度,验证该系统的可行性及有效性,有助于评估LED封装、模块、阵列的可靠性寿命,促进产品质量水平的提升。Reliability life evaluation is an urgent problem to be solved in the development of LED industry.A set of life test system simulating the actual working temperature,current and voltage of LED is designed to realize the functions of real-time monitoring,measuring and saving data of constant temperature accelerated life test.The feasibility and effectiveness of the system are verified through relevant tests and evaluation uncertainty,which is helpful to evaluate the reliability life of LED packages,modules and arrays,and promote the improvement of product quality.

关 键 词：LABVIEW LED 可靠性寿命 光通维持率 

分 类 号：TN23[电子电信—物理电子学]