用于压力传感器校准的高低温试验箱设计  

Design of High and Low Temperature Test Chamber for Pressure Sensor Calibration

作　　者：黄其刚[1] 李晶 白天 高炳涛 梅红伟[1] HUANG Qi-gang;LI Jing;BAI Tian;GAO Bing-tao;MEI Hong-wei(Beijing Aerospace Institute for Metrology and Measurement Technology,Beijing 100076,China)

机构地区：[1]北京航天计量测试技术研究所,北京100076

出　　处：《宇航计测技术》2022年第4期15-18,共4页Journal of Astronautic Metrology and Measurement

摘　　要：基于压力传感器在高低温环境下的校准需求,设计了一种专用高低温试验箱。其控制温度范围可达到-120℃~500℃。提出了高低温试验箱的总体方案,介绍了宽温区温度的实现方法以及高温和低温系统不兼容的解决方法和控制流程。试验验证结果显示,高低温试验箱达到了实现宽温区温度的目的,满足设计指标要求。Based on the calibration requirements of pressure sensors in high and low temperature environments, a special high and low temperature test chamber is designed. Its temperature range can reach-120℃~500℃. The overall scheme of the high and low temperature test chamber is proposed, the method for realizing the temperature in a wide temperature area is introduced, and the solution and control process for the incompatibility of high temperature and low temperature systems are proposed. The test verification results show that the high and low temperature test chamber achieves the purpose of realizing the temperature in a wide temperature range and meets the design index requirements.

关 键 词：宽温区 高低温 压力传感器 校准 

分 类 号：TB935[一般工业技术—计量学]