基于故障混叠度的模拟电路测点多目标选择  

Multi-objective selection of analog circuit test points based on fault aliasing degree

作　　者：张永超 尤枫[1] 王微微[1] 赵瑞莲[1] 尚颖[1] ZHANG Yongchao;YOU Feng;WANG Weiwei;ZHAO Ruilian;SHANG Ying(School of Information Science and Technology,Beijing University of Chemical Technology,Beijing100029,China)

机构地区：[1]北京化工大学信息科学与技术学院,北京100029

出　　处：《微电子学与计算机》2022年第9期80-88,共9页Microelectronics & Computer

基　　金：国家自然科学基金(62077003)。

摘　　要：模拟电路可测性设计中的测试节点选择方法通常使用一个电压阈值来确定所有故障的模糊程度,但实际上不同的故障需要的电压阈值是不同的.针对电压阈值设定问题,提出了一种基于聚类的故障混叠度计算方法,用于度量故障间的模糊程度.在此基础上,设计了一种模拟电路多目标测点选择方法,用于平衡测点数和隔离的故障数量之间的关系,以在尽可能少的测点数量下获得最大的故障隔离数.首先,利用小波包变换提取模拟信号特征;然后,通过聚类计算不同故障间的混叠度;最后,以故障隔离度和测点数量为目标,采用非支配排序遗传算法(NSGA-II)搜索测点集,实现模拟电路的测点选择.实验结果表明,相较于现有的测点选择方法,该方法在测点数量尽可能少的情况下可以获得最大的故障隔离数,实现了测点的优选.Test node selection methods in testability design of analog circuits usually use a voltage threshold to determine the fuzzy gap of all faults,but in fact,the voltage gap required by different faults is different.And for the voltage threshold setting problem,a clustering-based fault confusion calculation method is proposed to measure the degree of ambiguity between faults.On this basis,a multi-objective measurement point selection method for analogue circuits is designed to balance the number of measurement points and the number of faults isolated in order to obtain the maximum number of faults isolated with the lowest possible number of measurement points;Firstly,wavelet packet transform is used to extract the characteristics of analog signal.Then the aliasing degree between different faults is calculated by clustering;Finally,aiming at the fault isolation degree and the number of test points,the non-dominated sorting genetic algorithm NSGA-II is used to search the test point set to realize the test point selection of analog circuit.The experimental results show that compared with the existing measurement point selection methods,this method can obtain the maximum number of fault isolation when the number of measurement points is as small as possible,and realize the optimization of measurement points.

关 键 词：模拟电路 测点选择 聚类 小波包变换 遗传算法 

分 类 号：TN710[电子电信—电路与系统]