一类数字电位器的快速测试方法研究  

A Test Method of Digital Potentiometer Based on ATE

作　　者：沈锺杰 Shen Zhong-jie(The 58th Research Institute of China Electronics Technology Group Corporation,Jiangsu Wuxi 214122)

机构地区：[1]中国电子科技集团第五十八研究所,江苏无锡214122

出　　处：《电子质量》2022年第8期57-64,共8页Electronics Quality

摘　　要：该文研究了一类多通道数字电位器的主要功能和关键参数的测试方法,适用于含SPI或者I2C通讯模式的数字电位器ATE测试程序的快速开发。基于自动化测试设备设计了一种双通讯协议多通道的数字电位器的功能及参数测试方法。以DS1844-X为例,用EXCEL构造了稳定的测试向量自动生成平台,设计了多通道并行测试的程序,优化测试程序测试时间。This paper studies the test methods of main functions and key parameters of multi-channel digital potentiometers,which is suitable for development of ATE test program.Based on automatic test equipment,designs a function and parameter test method of dual communication protocol multi-channel digital potentiometer.Taking DS1844-X as an example,a stable test vector generation platform is constructed with Excel,the program for multi-channel parallel testing is designed,the program test time is optimized.

关 键 词：数字电位器 多通道 双通讯协议 自动化测试 

分 类 号：TM547[电气工程—电器]