液晶玻璃基板原片密度的检测与管控  

LCD Substrate Glass Density Detection and Control

作　　者：何流 殷明瑞 易元 闵蛟 HE Liu;YIN Mingrui;YI Yuan;MIN Jiao(Chengdu COE Optoelectronics Technology Co.,Ltd.,Chengdu 611731,China)

机构地区：[1]成都中光电科技有限公司,成都611731

出　　处：《玻璃》2022年第9期41-44,共4页Glass

摘　　要：密度是玻璃基板最重要的物性指标之一。传统方法中,检测密度时要对样品进行精密退火,以消除残余应力的影响,但该方法不能客观精准地反应玻璃基板性能的变化。通过运用浮力法分别对退火前后玻璃基板的密度进行测试分析,结果显示,玻璃基板原片密度的波动大于退火后密度的波动。因此,有必要对玻璃基板原片的密度进行检测和管控。Density is the crucial physical property parameter of the glass substrate.In the conventional method, precision annealing is performed on sample to eliminate the effect of residual stress.However,this method can not reflect the performance of glass substrate objectively and accurately. In this paper,the density of glass substrate before and after annealing was tested and analyzed by buoyancy method.The results show that the density fluctuation of glass substrate is greater than that after annealing. So it is necessary to test and control the original density of glass substrates.

关 键 词：液晶显示 玻璃基板 原片密度 退火 

分 类 号：TQ171[化学工程—玻璃工业]