我国冶金分析定量检测仪器的发展趋势  

Development trend of quantitative detecting instruments for metallurgical analysis in China

作　　者：李华昌 王东杰 冯先进 LI Huachang;WANG Dongjie;FENG Xianjin(BGRIMM Technology Group,Beijing 100160,China;BGRIMM MTC Technology Co.,Ltd.,Beijing 102628,China)

机构地区：[1]矿冶科技集团,北京100160 [2]北矿检测技术有限公司,北京102628

出　　处：《冶金分析》2022年第8期1-12,共12页Metallurgical Analysis

基　　金：国家重点研发计划项目(2021YFC2903101)。

摘　　要：为了了解我国分析仪器的发展,推动冶金分析领域定量检测技术的进步,文章以北京分析测试学术报告会暨展览会(BCEIA)在国内的展示成果为依托,选择电感耦合等离子体发射光谱(ICP-OES)、电感耦合等离子体质谱(ICP-MS)、X射线荧光光谱(XRF)、激光诱导击穿光谱(LIBS)等基础定量检测仪器为主要分析对象,归纳总结了这些仪器的发展过程、基本原理和主要结构。从分析检测人员的视角,讨论了该检测仪器的优势特点及应用效果;展望了定量分析检测技术的发展趋势;提出了以定量检测仪器为基础的新型高端科学仪器的发展前景。又以激光剥蚀电感耦合等离子体质谱(LA-ICP-MS)、辉光放电质谱(GD-MS)、电子探针X射线显微分析仪(EPMA)等拓展联用检测仪器为例,介绍了设备的主要特点及应用,最终总结出LA-ICP-MS为固体样品中微量元素分析的常用技术,GD-MS技术是痕量元素分析的重要手段,EPMA技术因具有与其他仪器结合包容性高的优点,虽然在使用过程中存在一定的缺陷,但已成为通用的分析手段。而我国定量分析检测技术正朝着现场化、专用化及标准化的方向发展。In order to understand the development of analytical instruments in China and promote the progress of quantitative detection technology in the field of metallurgical analysis,the development process,basic principle and main structure of several basic quantitative detecting instruments,including inductively coupled plasma optical emission spectrometer(ICP-OES),inductively coupled plasma mass spectrometer(ICP-MS),X-ray fluorescence spectrometer(XRF)and laser induced breakdown spectroscopy(LIBS),which were exhibited in Beijing Conference and Exhibition on Instrumental Analysis(BCEIA),were summarized and reviewed.The advantages,characteristics and application effects of these detection instruments were discussed from the perspective of the analysis and detection personnel.The development trend of quantitative analysis and detection technologies were prospected.The development prospects of new high-end scientific instruments based on quantitative detection instruments were proposed.Secondly,laser ablation-inductively coupled plasma mass spectrometer(LA-ICP-MS),glow discharge mass spectrometer(GD-MS),electron microprobe(EPMA)and other extended combined detection instruments were as examples to introduce the main features and applications of the equipment.Finally,it was concluded that LA-ICP-MS became the common technique for the analysis of trace elements in solid samples.GD-MS technique was an important approach for the analysis of trace elements.EPMA technology had the advantages of high compatibility in combination with other instruments,it had become a universal tool of analysis although there were certain defects in the process of use.The quantitative analysis and detection technology in China is developing towards the direction of on-site,specialization and standardization.

关 键 词：北京分析测试学术报告会暨展览会(BCEIA) 定量分析 发展趋势 电感耦合等离子体发射光谱法(ICP-OES) 电感耦合等离子体质谱法(ICP-MS) X射线荧光光谱法(XRF) 激光诱导击穿光谱法(LIBS) 

分 类 号：O657.3[理学—分析化学] TF031[理学—化学]