二次筛选外部目检缺陷介绍与控制  

Introduction and Control of External Visual Inspection Defects in Secondary Screening

作　　者：季仇斌 唐韬 于佳伟 盛锐 鄢晓玲 Ji Qiu-bin;Tang Tao;Yu Jia-wei;Sheng Rui;Yan Xiao-ling(China Electronics Technology Group Corporation No.58 Research Institute,Jiangsu Wuxi 214072)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214072

出　　处：《电子质量》2022年第9期106-109,共4页Electronics Quality

摘　　要：二次筛选涉及电子元器件种类繁多,电子元器件是电子行业发展的基础,其质量和可靠性受到了使用方的普遍重视。首先,具体介绍了常见外观缺陷及其产生原因;然后,从环境条件、人员管理、筛选过程管理等方面,阐述了外观质量控制方法;最后,对电子元器件的检查和修复方法进行了概述。Secondary screening involves a wide variety of electronic components. Electronic components are the foundation of the development of the electronic equipment, and their quality and reliability have been widely valued by users. First, the common appearance defects and their causes are introduced in detail. Then, the appearance quality control methods are expounded from the aspects of environmental conditions, personnel management, and screening process management. Finally, the inspection and repair methods of electronic components are summarized.

关 键 词：电子元器件 外部目检缺陷 质量控制 

分 类 号：TN60[电子电信—电路与系统]