Erratum to “Accurate determination of film thickness by low-angle x-ray reflection”  

作　　者：Ming Xu Tao Yang Wenxue Yu Ning Yang Cuixiu Liu Zhenhong Mai Wuyan Lai Kun Tao 徐明;杨涛;于文学;杨宁;刘翠秀;麦振洪;赖武彦;陶琨(Institute of Physics&Center for Condensed Matter Physics,Chinese Academy of Sciences,Bejing 100080,China;Department of Materials Science Jilin Universiy,Changchun 130023,China;Department of Materials Science,Tsinghua University Beijing 100083,China)

机构地区：[1]Institute of Physics&Center for Condensed Matter Physics,Chinese Academy of Sciences,Bejing 100080,China [2]Department of Materials Science Jilin Universiy,Changchun 130023,China [3]Department of Materials Science,Tsinghua University Beijing 100083,China

出　　处：《Chinese Physics B》2022年第9期658-658,共1页中国物理B（英文版）

摘　　要：Equation(6)in Chin.Phys.090833(2000)is corrected.All subsequent derivations were given based on the correct Eq.(6),so the conclusions in the paper are not ffected by the rrata.

关 键 词：erratum film thickness X-RAY 

分 类 号：O4-5[理学—物理] G23[文化科学]