Differences in MBUs induced by high-energy and medium-energy heavy ions in 28 nm FPGAs  

作　　者：Shuai Gao Jin-Hu Yang Bing Ye Chang Cai Ze He Jie Liu Tian-Qi Liu Xiao-Yu Yan You-Mei Sun Guo-Qing Xiao 

机构地区：[1]Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000,China [2]University of Chinese Academy of Sciences,Beijing 100049,China [3]State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China [4]State Key Laboratory of Analog and Mixed-Signal VLSI,University of Macao,Macao 999078,China

出　　处：《Nuclear Science and Techniques》2022年第9期28-36,共9页核技术（英文）

基　　金：the National Natural Science Foundation of China(Nos.12035019 and 12105339).

摘　　要：Multiple-bit upsets(MBUs)have become a threat to modern advanced field-programmable gate arrays(FPGAs)applications in radiation environments.Hence,many investigations have been conducted using mediumenergy heavy ions to study the effects of MBU radiation.However,high-energy heavy ions(HEHIs)greatly affect the size and percentage of MBUs because their ionizationtrack structures differ from those of medium-energy heavy ions.In this study,the different impacts of high-energy and medium-energy heavy ions on MBUs in 28 nm FPGAs as well as their mechanisms are thoroughly investigated.With the Geant4 calculation,more serious energy effects of HEHIs on MBU scales were successfully demonstrated.In addition,we identified worse MBU responses resulting from lowered voltages.The MBU orientation effect was observed in the radiation of different dimensions.The broadened ionization tracks for tilted tests in different dimensions could result in different MBU sizes.The results also revealed that the ionization tracks of tilted HEHIs have more severe impacts on the MBU scales than mediumenergy heavy ions with much higher linear energy transfer.Therefore,comprehensive radiation with HEHIs is indispensable for effective hardened designs to apply highdensity 28 nm FPGAs in deep space exploration.

关 键 词：FPGA High-energy heavy-ion radiation MBU Ionization track 

分 类 号：TP333[自动化与计算机技术—计算机系统结构] TN791[自动化与计算机技术—计算机科学与技术]