纳米SiO_(2)表面羟基数测定的研究进展  

Research progress on the determination of surface hydroxyl groups number of nano-SiO_(2)

作　　者：程云龙 赵明伟[1] 高明伟 闫若勤 郭旭 CHENG Yun-long;ZHAO Ming-wei;GAO Ming-wei;YAN Ruo-qin;GUO Xu(Key Laboratory of the Ministry of Education of Unconventional Oil and Gas Development,School of Petroleum Engineering,China University of Petroleum(East China),Qingdao 266580,China)

机构地区：[1]中国石油大学(华东)石油工程学院非常规油气开发教育部重点实验室,山东青岛266580

出　　处：《应用化工》2022年第9期2698-2703,共6页Applied Chemical Industry

基　　金：国家自然科学基金委员会(52074333)。

摘　　要：综述了纳米SiO_(2)颗粒表面羟基数量测定的两种常用方法:物理法和化学法,并对以往学者进行纳米SiO_(2)表面羟基数的测定以及对当前研究进展进行整理分析,总结了各方法的优势、不足及未来的发展趋势。This paper summarizes two common methods for determining the amount of hydroxyl on the surface of nano-SiO_(2) particles:physical and chemical methods,and makes a collated analysis of the determination of hydroxyl on the surface of nano-SiO_(2) and the current research progress,summarizing the advantages,shortcomings and future development trends of each method.

关 键 词：表面羟基 测定方法 物理法 化学法 综述 

分 类 号：TQ9[化学工程]