高速、低功耗运放电路的高温测试方案设计浅谈  

High temperature test position design of small signal operational amplifier

作　　者：郭敦敦 霍军军[2] 张亚峰 陈祯 GUO Dun-dun;HUO Jun-jun;ZHANG Ya-feng;CHEN Zhen(Tianshui Huatian Technology Co.,Ltd.)

机构地区：[1]天水华天科技股份有限公司测试开发部 [2]天水华天科技股份有限公司

出　　处：《中国集成电路》2022年第9期85-89,共5页China lntegrated Circuit

摘　　要：目前高速、低功耗运放有着广阔的应用前景,这类运放对高温分选机的测试位设计有一定特殊要求。本文介绍了此类运放相关电性能参数测试异常的失效分析及改善措施,对其高温测试方案设计具有一定的参考意义。At present,high-frequency,low-power,low-current,low-voltage and wide-gain op amp products have broad application prospects,but the high-temperature handler test site design of such products has high requirements.This paper introduces the failure cause analysis of special test items for such high-precision op amp products and the improved design scheme,which has reference significance for the design of high-temperature test site and high-temperature test boards of high-temperature handlers.

关 键 词：高速、低功耗运放 高温分选机 失效分析 

分 类 号：TN722.77[电子电信—电路与系统]