红外材料低温线膨胀系数测量装置的设计及其误差分析  

Design and Error Analysis of Measuring Device for Low Temperature Linear Expansion Coefficient of Infrared Materials

作　　者：王建国 倪磊[1] 向北平[1] 毛记祥 WANG Jianguo;NI Lei;XIANG Beiping;MAO Jixiang(Key Laboratory of Testing Technology for Manufacturing Process,Ministry of Education,Southwest University of Science and Technology,Mianyang 621010,Sichuan,China)

机构地区：[1]西南科技大学制造过程测试技术教育部重点实验室,四川绵阳621010

出　　处：《西南科技大学学报》2022年第3期77-82,共6页Journal of Southwest University of Science and Technology

基　　金：四川省教育厅项目(17zb0451)。

摘　　要：为获取固体材料低温下的线膨胀系数数据,特别是红外材料在低温下的线膨胀系数数据,设计了一种基于变极距式电容传感器的测量装置。采用ANSYS热力学分析检验了整个测量装置,热平衡后的温差为0.437 K,所需功率为3.3 W,以锗为样品进行了测量误差分析,相对误差仅为0.37%,满足使用要求。该装置可测红外材料在20 K到常温之间的线膨胀系数,具有适用范围广、易于操作、可快速达到热平衡的优点。To obtain linear expansion coefficient data of solid materials at low temperature,especially the data of infrared materials,a measuring device based on variable-pole-distance capacitive sensor was designed.The whole measuring device was tested by ANSYS thermodynamic analysis,the temperature difference after thermal equilibrium is 0.437 K,and the required power was 3.3 W.The error analysis was carried out with germanium as the sample,and the relative error of the device was 0.37%,which met the requirements of use.The device can measure the linear expansion coefficient of infrared materials from 20 K to room temperature.It has the advantages of wide application range,easy operation,and quick thermal balance.

关 键 词：红外材料 线膨胀系数 测量装置 误差分析 

分 类 号：TN213[电子电信—物理电子学]