Co掺杂Bi_(3.15)Nd_(0.85)Ti_(3)O_(12)的介电性能分析  

Dielectric properties of Co-doped Bi_(3.15)Nd_(0.85)Ti_(3)O_(12) ceramics

作　　者：汤雪琴 何永杰 周杨馨 孙奥 陈晓琴[1] 曾令会 TANG Xueqin;HE Yongjie;ZHOU Yangxin;SUN Ao;CHEN Xiaoqin;ZENG Linghui(Faculty of Physics&Electronic Sciences,Hubei University,Wuhan 430062,China;Chengdu Rail Transit Group Co.,Ltd.,Chengdu 610031,China)

机构地区：[1]湖北大学物理与电子科学学院,湖北武汉430062 [2]成都地铁运营有限公司,四川成都610031

出　　处：《湖北大学学报（自然科学版）》2022年第6期715-720,共6页Journal of Hubei University：Natural Science

基　　金：国家自然科学基金(51002047、11274101)资助。

摘　　要：采用溶胶-凝胶燃烧法将Co掺杂到Bi_(3.15)Nd_(0.85)Ti_(3)O_(12)(BNdT)基陶瓷中,制备出Bi_(15)Nd_(0.85)Ti_(3-x)Co_(x) O_(12)(BNdT-CX,x=0,0.2,0.4,0.6)陶瓷.使用X线衍射仪(XRD)对其晶体结构进行表征发现,掺杂并没有改变基陶瓷的晶体结构.通过扫描电子显微镜(SEM)对陶瓷微观形貌进行表征发现,其晶粒均呈现片状.通过掺杂探究该材料的介电弛豫机制,并根据拟合得到介电模量的激活能,结果表明其介电弛豫机制是由氧空位的缺陷所引起的.Bi_(15)Nd_(0.85)Ti_(3-x)Co_(x) O_(12)(BNdT-CX,x=0,0.2,0.4,0.6)ceramics were prepared by sol-gel combustion method by doping Co into Bi_(15)Nd_(0.85)Ti_(3-x)Co_(x) O_(12)(BNdT)ceramics.The crystal structure was characterized by X-ray diffractometer(XRD),and it was found that the Co-doping does not change the crystal structure of the ceramics.Scanning electron microscopy(SEM)was used to characterize the microstructure of the ceramics.The dielectric relaxation mechanism was investigated and was found to be caused by the oxygen vacancy.

关 键 词：钙钛矿 掺杂 介电弛豫 氧空位 激活能 

分 类 号：O469[理学—凝聚态物理]