基于X射线断层扫描的小麦籽粒模型构建及离散元参数标定  被引量:3

Construction of Wheat Grain Model and Calibration of Discrete Element Parameters Based on X-Ray Tomography

在线阅读下载全文

作  者:朱康 惠延波[1] 周颖 王宏晓[1] 张云龙 李辉[1] 陈艳雷[1] 郑金锋[1] 白路遥 Zhu Kang;Hui Yanbo;Zhou Ying;Wang Hongxiao;Zhang Yunlong;Li Hui;Chen Yanlei;Zheng Jinfeng;Bai Luyao(Institute of Advanced Manufacturing,Henan University of Technology,Zhengzhou 450001)

机构地区:[1]河南工业大学先进制造研究所,郑州450001

出  处:《中国粮油学报》2022年第9期218-223,共6页Journal of the Chinese Cereals and Oils Association

摘  要:为构建精准的离散元模型,标定离散元仿真参数,本实验以小麦为研究对象,基于X射线断层扫描技术获取1024张不同灰度值的二维切片,采用图像滤波、图像分割等算法构建小麦籽粒的三维外轮廓模型;在EDEM中导入小麦外轮廓模型,构建了4种不同数量的填充球模型来拟合小麦籽粒的真实形状;通过休止角实际实验与EDEM仿真实验,运用Plackett-Burman实验、最陡爬坡实验、响应面优化实验标定了小麦离散元仿真参数;最后对标定的离散元参数进行仿真分析并与实际实验进行对比,发现仿真值与实际值相对误差小于1.30%,表明本方法构建的离散元模型及标定的参数可用于仿真实验。In order to build an accurate discrete element model and calibrate the simulation parameters of discrete element,in the present paper,wheat was taken as the research object,1024 two-dimensional slices with different gray values based on X-ray tomography technology were obtained,and the three-dimensional outer contour model of wheat grain by using image filtering,image segmentation and other algorithms were constructed.The wheat contour model was imported into EDEM,and four kinds of filling pellet models with different numbers were constructed to fit the real shape of wheat grains.Through the actual experiment of repose angle and EDEM simulation experiment,the discrete element simulation parameters of wheat were calibrated by using Plackett Burman experiment,steepest climbing experiment and response surface optimization experiment.Finally,the calibrated discrete element parameters were simulated and compared with the actual experiment.It was found that the relative error between the simulation value and the actual value was less than 1.30%,indicating that the discrete element model and calibrated parameters constructed by this method could be used in the simulation experiment.

关 键 词:离散元模型 参数标定 小麦 X射线断层扫描 休止角 

分 类 号:TP391.9[自动化与计算机技术—计算机应用技术] S220.1[自动化与计算机技术—计算机科学与技术]

 

参考文献:

正在载入数据...

 

二级参考文献:

正在载入数据...

 

耦合文献:

正在载入数据...

 

引证文献:

正在载入数据...

 

二级引证文献:

正在载入数据...

 

同被引文献:

正在载入数据...

 

相关期刊文献:

正在载入数据...

相关的主题
相关的作者对象
相关的机构对象