皮秒脉冲激光产生的X射线源能谱精密诊断  

Spectrum measurements for picosecond laser produced X-ray sources

作　　者：张强强[1] 于明海 魏来[1] 杨祖华[1] 陈勇[1] 范全平[1] Zhang Qiangqiang;Yu Minghai;Wei Lai;Yang Zuhua;Chen Yong;Fan Quanping(Laser Fusion Research Center,CAEP,Mianyang 621900,China)

机构地区：[1]中国工程物理研究院激光聚变研究中心,四川绵阳621900

出　　处：《强激光与粒子束》2022年第12期53-58,共6页High Power Laser and Particle Beams

基　　金：supported by National Natural Science Foundation of China(011905201,011905200)。

摘　　要：针对皮秒脉冲激光产生的X射线能谱精密诊断需求,提出了一种晶体谱仪,该谱仪使用曲率为200 mm的透射式石英弯晶作为色散元件,测谱范围可覆盖8~60 keV。使用该谱仪在星光III和神光II升级装置进行了应用,成功获得了铜、钼、银等元素的特征线能谱,以及金的L壳层特征线,测量获得的能谱信噪比较高,显示了谱仪在测量皮秒激光产生的X射线能谱上的良好性能。In this paper, a transmission curved crystal spectrometer is developed. The transmission curved crystal spectrometer employs a quartz crystal with radius of 200 mm covering the measuring range of 8 keV to 60 keV.We have applied the spectrometer to measure X-ray sources driven by picosecond laser both at XG-Ⅲ and the SGII-Updated laser facility. The characteristic Kα and Kβ line emissions from Cu, Mo, Ag, and Zr were measured.Specifically, the L-shell emissions from Au targets irradiated by the picosecond lasers with different pulse duration were compared. The spectra show good signal-to-noise ratio, which indicates the spectrometer is suitable for the diagnostic of picosecond laser produced X-ray sources.

关 键 词：激光等离子体诊断 X射线能谱 透射弯晶谱仪 激光等离子体 

分 类 号：O434.13[机械工程—光学工程]