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作 者:郝子恒 孙超 李阳 杨凯莉 张妮 朱宇峰 李朋博 殷万鹏 HAO Ziheng;SUN Chao;LI Yang;YANG Kaili;ZHANG Ni;ZHU Yufeng;LI Pengbo;YIN Wanpeng(Science and Technology on Low-Light-Level Night Vision Laboratory,Xi'an 710065,China;Kunming Institute of Physics,Kunming 650223,China)
机构地区:[1]微光夜视技术重点实验室,陕西西安710065 [2]昆明物理研究所,云南昆明650223
出 处:《应用光学》2022年第6期1175-1180,共6页Journal of Applied Optics
基 金:国防基础科研项目(JCKY2018208B016)。
摘 要:防离子反馈膜是三代微光像增强器的重要组成部分,其质量对像增强器的寿命和视场起着至关重要的作用。研究了防离子反馈膜质量对像增强器视场的影响。选取具有典型缺陷的防离子反馈微通道板(micro-channel plate,MCP),对防离子反馈微通道板在工作时的视场和防离子反馈膜质量进行分析,获得了防离子反馈膜的缺陷对微光像增强器工作时视场的影响。分析得到防离子反馈膜制备过程中缺陷产生的原因,并初步提出缺陷的解决方案,对后续制备出高质量防离子反馈膜有着非常积极的作用。Ion barrier film is an important part of the third generation low-level-light image intensifier,and its quality plays an crucial role in lifetime and field of view of image intensifier.The effect of ion barrier film quality on the field of view of image intensifier was studied.The ion barrier micro-channel plate(MCP)with typical defects was selected to analyze the field of view of ion barrier MCP at runtime and the quality of ion barrier film,and the effect of ion barrier film defects on field of view of image intensifier at runtime was obtained.The reason for the defects generated in the preparation process of ion barrier film was analyzed,and the solutions to defects were preliminarily put forward,which had a very positive effect on the subsequent preparation of high-quality ion barrier film.
分 类 号:TN223[电子电信—物理电子学]
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