射频集成电路校准技术综述  

An Overview on Calibration Techniques for Radio Frequency Integrated Circuits

作　　者：李松亭 颜盾 LI Songting;YAN Dun(College of Aerospace Science and Engineering,National University of Defense Technology,Changsha 410073,China;Colleage of Information Science and Engineering,Hunan University,Changsha 410082,China)

机构地区：[1]国防科技大学空天科学学院,长沙410073 [2]湖南大学信息科学与工程学院,长沙410082

出　　处：《电子与信息学报》2022年第11期4058-4074,共17页Journal of Electronics & Information Technology

基　　金：国家自然科学基金(61804182);湖南省自然科学基金(2019JJ50741)。

摘　　要：射频集成电路(RFICs)对工艺偏差、器件失配、器件非线性等引入的静态非理想因素以及温度变化、增益改变、输入/输出频率变动等引入的动态非理想因素所表现出的鲁棒性较差。该文深入挖掘影响射频集成电路性能的关键因素,并对典型的校准算法进行归纳和总结,为高性能射频集成电路设计提供理论支撑。Radio Frequency Integrated Circuits(RFICs)show poor robustness to static non-ideal factors introduced by process deviations,device mismatches,device nonlinearities,and dynamic non-ideal factors introduced by temperature changes,gain changes,and input/output frequency changes.The key factors that affect the performance of RFICs are excavated deeply,and typical calibration algorithms are summarized to provide theoretical support for the design of high-performance RFICs.

关 键 词：射频集成电路 校准技术 射频收发链路 频率综合器 多片同步 

分 类 号：TN43[电子电信—微电子学与固体电子学]