高加速寿命试验技术分析及应用研究  

Analysis and Application of Highly Accelerated Life Test

作　　者：康京山[1] KANG Jingshan(The 54th Research Institute of CETC,Shijazhuang 050081,China)

机构地区：[1]中国电子科技集团公司第五十四研究所,河北石家庄050081

出　　处：《电子产品可靠性与环境试验》2022年第5期89-95,共7页Electronic Product Reliability and Environmental Testing

摘　　要：高加速寿命试验有望成为设计师提高可靠性的利器。然而,研发人员往往认为试验中所激发的故障模式在实际的使用条件下不可能发生,因此,对于通过解决试验中发现的问题进而提高产品可靠性的动力不足。另一方面,由于缺乏面向具体产品的严谨分析和试验设计,试验人员往往只是施加通用环境应力并且简单地增大应力量值,导致遗漏不少关联故障模式又激发大量的非关联故障模式。这些问题都严重地影响其效能和更大范围的推广。基于5W2H模型,对HALT技术及其应用进行了系统性的分析,对若干实际问题进行了讨论,以使试验人员正确地运用这项技术以取得对提高产品可靠性真正有价值的结果,使各个相关方可以准确地理解和利用试验结果。HALT is expected to become a powerful weapon for developers to improve reliability.However, developers often believe that the failure modes stimulated by HALT would not occur under the actual use conditions, and they have little incentive to improve product reliability by solving problems identified during testing. On the other hand, due to the lack of rigorous analysis and testing design for specific product, testers often apply only commonly used environmental stress and simply increase the level of stress step by step, resulting in missing many relevant failure modes but stimulating too many non-relevant failure modes. These problems are affecting its effectiveness and popularization seriously. Based on 5W2H model, HALT technology and its application are analyzed systematically, and some practical problems are discussed, so that testers can use HALT correctly to obtain results that are really valuable to improve product reliability,and stakeholders can accurately understand and use the testing results.

关 键 词：可靠性试验 高加速寿命试验 可靠性强化试验 故障模式 裕度 应力 

分 类 号：TB114.3[理学—概率论与数理统计]