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作 者:焦永昌[1] 张依轩 朱明达 张玉[1] 翦璋 JIAO Yong-chang;ZHANG Yi-xuan;ZHU Ming-da;ZHANG Yu;JIAN Zhang(Science and Technology on Antennas and Microwave Laboratory,Xidian University,Xi'an 710071,China)
机构地区:[1]西安电子科技大学天线与微波技术重点实验室,西安710071
出 处:《微波学报》2022年第5期22-28,共7页Journal of Microwaves
基 金:中央高校基本科研业务费专项资金(QTZX22155)。
摘 要:研究了三种针对一维线天线阵列的快速近场测量方法,仅需二维近场扫描数据即可外推出线阵的单切面远场方向图。这三种单切面远场方向图测量方法包括平面/柱面波波谱展开法、等效源求解法和多极子平面波展开法。针对单切面方向图测量中二维格林函数存在的幅度误差,提出了一种幅度误差补偿方法,显著降低了原始近场数据外推变换得到的远场方向图的幅度测量误差。通过矩量法仿真得到的一维低副瓣线天线阵近远场数据及其比较结果验证了所提出方法的有效性,并通过仿真算例对比分析了不同外推方法之间的优缺点。其中基于计算电磁学的等效源展开方法及多极子平面波展开方法因其具有显著减少的采样点数、不存在数据截断以及灵活的采样位置等优点,可广泛应用于多种一维线阵单切面方向图测试应用场景中。In this paper, three fast near-field measurement methods for one-dimensional(1 D) linear antenna arrays are studied, in which only two-dimensional(2 D) near-field scanning data are used to extrapolate single-cut far-field patterns of the linear arrays. These three single-cut near-field pattern measurement methods include the plane/cylindrical wave spectral expansion method, the equivalent source solution method and the multipole plane wave expansion method. For the amplitude errors existing in the 2 D Green′s function in the single-cut pattern measurements, an amplitude error compensation method is proposed, and the amplitude measurement errors in the far-field patterns obtained by the extrapolation transformation from the original near-field data can be significantly reduced. Simulated near and far field data of the 1 D low-sidelobe linear antenna array are used to verify effectiveness of the proposed method, and pros as well as cons of three different extrapolation methods are compared and analyzed by using some simulated examples. Among them, the equivalent source expansion method and the multipole plane wave expansion method, both of which are based on computational electromagnetics, can be widely used in many application scenarios for measuring single-cut far-field patterns of the 1 D linear antenna arrays, due to their advantages such as significantly reduced sampling points, no data truncation effects, and flexible sampling locations.
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