一种红外探测器冷头结构的设计优化  

Design Optimization of a Cold Head Structure of Infrared Detector

作　　者：张利明[1] 刘伟[1] 王冠[1] 付志凯 于小兵[1] ZHANG Li-ming;LIU Wei;WANG Guan;FU Zhi-kai;YU Xiao-bing(North China Research Institute of Electro-Optics,Beijing 100015,China)

机构地区：[1]华北光电技术研究所,北京100015

出　　处：《红外》2022年第11期20-25,共6页Infrared

摘　　要：针对某红外探测器工作时冷头结构发生异常、热阻变大以致冷头芯片不到温的现象,开展了相关研究。采用Ansys有限元软件对该红外探测器的冷头结构进行了仿真分析,并结合分析结果对其进行了优化设计。通过仿真分析发现,优化后的冷头结构在保证探测器芯片低温应力与低温变形的情况下,可以显著降低冷头表面及冷头结构件的应力。按照优化后的冷头结构来装配三个新状态的红外探测器组件,并对其进行了1000次的老炼实验。结果表明,实验前后冷头的强度、探测器响应的非均匀性和盲元率等关键指标并未发生变化;优化后冷头结构的可靠性更高,有利于探测器的长期使用;优化方案合理。In view of the phenomenon that the cooling head structure of an infrared detector is abnormal,the thermal resistance becomes large and the cooling head chip is not warm,the related research is carried out.In this paper,Ansys finite element software is used to carry out the simulation analysis of the cold head structure of the infrared detector.And the optimization design is carried out according to the analysis results.Through simulation analysis,it is found that under the condition of ensuring the low temperature stress and low temperature deformation of the detector chip,the stresses on the surface of the cold head and the structural parts of the cold head are significantly reduced.According to the optimized cold head structure,three new state infrared detector components are assembled.And 1000 times of aging experiments are conducted.The results show that the strength of cold head,non-uniformity of detector response,blind element rate and other key indicators do not change before and after the experiment.It is confirmed that the optimized cold head structure has higher reliability,which is beneficial to the long-term use of the detector,and the optimization scheme is reasonable.

关 键 词：红外探测器 冷头结构优化 可靠性 

分 类 号：TN215[电子电信—物理电子学]