变应力条件下低压断路器剩余电寿命预测  

Residual Electrical Life Prediction of Low-voltage Circuit Breakers Under Varied Stress

作　　者：赵成晨 李奎[1] 胡博凯 马典良 赵伟焯 张广智 ZHAO Chengchen;LI Kui;HU Bokai;MA Dianliang;ZHAO Weizhuo;ZHANG Guangzhi(State Key Laboratory of Reliability and Intelligence of Electrical Equipment(Hebei University of Technology),Beichen District,Tianjin 300401,China;Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province(Hebei University of Technology),Beichen District,Tianjin 300401,China;Shanghai Liangxin Electrical Co.,Ltd.,Pudong New District,Shanghai 200137,China)

机构地区：[1]省部共建电工装备可靠性与智能化国家重点实验室(河北工业大学),天津市北辰区300401 [2]河北省电磁场与电器可靠性重点实验室(河北工业大学),天津市北辰区300401 [3]上海良信电器股份有限公司,上海市浦东新区200137

出　　处：《中国电机工程学报》2022年第21期8004-8015,共12页Proceedings of the CSEE

基　　金：国家自然科学基金项目(51777056,51937004)。

摘　　要：低压断路器开断过程中电弧对触头的侵蚀是引起触头系统失效的主要原因,实际服役过程中低压断路器承受的电流应力是不断变化的,电流应力不同电弧侵蚀程度也不同。该文研究触头质量损失和燃弧特征量(电弧电量、焦耳积分和燃弧能量)的关系,根据不同的电弧侵蚀机理划分电流范围,利用分段函数描述电弧侵蚀因子与电流应力的关系,建立不同电流范围内电弧侵蚀因子数学模型;利用分段函数描述平均触头质量损失率与电流应力的关系,建立不同电流范围内平均触头质量损失率数学模型;根据不同的现场信息,提出3种变应力条件下低压断路器的剩余电寿命预测方法;通过不同电流应力下电寿命试验来模拟低压断路器触头系统的性能变化,由先验信息确定预测模型参数,并对同批次低压断路器进行变应力条件下电寿命验证试验,证明剩余电寿命预测模型的准确性,为低压断路器可靠性评估提供理论基础。The contact system failures of low-voltage circuit breakers are caused by the arc erosion during breaking electrical circuits. Low-voltage circuit breaker suffers from large fluctuations under current stress during service process,and the arc erosion degree varies with current stress. In this paper, the relationship between contact mass loss and arc characteristics(arc charge, joule integral and arc energy) was analyzed. The current was divided into several segments according to different arc erosion mechanisms. The relationship between arc erosion factor and current was described by piecewise function, and the arc erosion factor model in different current ranges was established. The relationship between average contact mass loss rate and current was illustrated by piecewise function, and the average contact mass loss rate model in different current ranges was built. According to different field test information, three residual electrical life prediction methods of low-voltage circuit breakers under varied stress were proposed. The performance changes of contact system were imitated by the electrical life test under different currents, and the model parameters were calculated by prior test information. The accuracy of the residual electrical life prediction model was proved by the verification test of the same batch of low-voltage circuit breakers under varied stress,which provided a theoretical basis for the reliability evaluation of low-voltage circuit breakers.

关 键 词：低压断路器 触头电磨损 电流应力 电弧侵蚀因子 剩余电寿命 

分 类 号：TM561[电气工程—电器]