简述透射电子显微镜发展历程  

A brief review on the history of the development of transmission electron microscope

作　　者：董全林[1] 蒋越凌 王玖玖 张春熹[1] DONG Quan-lin;JIANG Yue-ling;WANG Jiu-jiu;ZHANG Chun-xi(School of Instrumentation Science and Opto-electronics Engineering,Beihang University,Beijing 100191,China)

机构地区：[1]北京航空航天大学仪器科学与光电工程学院,北京100191

出　　处：《电子显微学报》2022年第6期685-688,共4页Journal of Chinese Electron Microscopy Society

基　　金：国家科技支撑计划项目(2006BAK03A24)。

摘　　要：透射电子显微镜是高端科学仪器,与科学技术的进步、国家的发展密切相关。本文简述了国内外透射电子显微镜的发展历程,为其发展理清历史脉络,以促进透射电子显微镜及其相关扩展仪器与类似设备的良好发展,使我国电子束技术得到更广泛的应用。Transmission electron microscope(TEM) is a high-end scientific instrument,and it is closely related to the technological advancements and the development of a country.This work briefly introduces the history of the development of TEM domestically and abroad to promote the developments of TEM and related instruments,and to boost a wide range of applications of our electron beam technologies.

关 键 词：透射电子显微镜 发展历程 

分 类 号：TH7[机械工程—仪器科学与技术] O46[机械工程—精密仪器及机械]