SF6断路器开断过程中固体分解产物研究  

Study on Solid Decomposition Products During Interruption Period of SF6 Circuit Breaker

作　　者：杨韧 张晓 彭雅楠 林德智 吕厚华 张伟强[2] YANG Ren;ZHANG Xiao;PENG Yanan;LIN Dezhi;LYU Houhua;ZHANG Weiqiang(Power Research Institute of State Grid Shaanxi Electric Power Company Limited,Xi’an 710100,China;Xi’an Key Laboratory of Organometallic Material Chemistry,School of Chemistry and Chemical Engineering,Shaanxi Normal University,Xi’an 710119,China;School of Electrical Engineering,Xi’an Jiaotong University,Xi’an 710049,China)

机构地区：[1]国网陕西省电力有限公司电力科学研究院,西安710100 [2]陕西师范大学化学化工学院西安市金属有机材料化学重点实验室,西安710119 [3]西安交通大学电气工程学院,西安710049

出　　处：《高压电器》2022年第12期21-27,36,共8页High Voltage Apparatus

基　　金：国网陕西省电力有限公司科技项目资助项目(5226KY22000H)。

摘　　要：研究固体分解产物是探明SF_(6)断路器金属有机材料腐蚀机制的重要科学手段。文中以40.5 k V SF_(6)断路器为实验对象,研究了不同电流大小、极性、开断次数下触头和喷口本体材料电热腐蚀程度的影响。开断实验后对断路器进行解体发现,大电流开断导致动静弧触头的腐蚀,正极性开断加速了动弧触头的腐蚀,在触头表面及灭弧室底部有固体分解产物产生。利用扫描电子显微镜(SEM)、X射线能谱(EDS)、粉末晶体衍射(XRD)技术分析了固体分解产物的化学组成,发现触头表面固体分解产物包括Cu_(2)O、Cu_(2)S、无定型碳单质和碳氟烃沉积物,灭弧室底部固体分解产物包括CuF_(2)、Cu_(2)O、SiO_(2)和聚四氟乙烯粉末。实验结果表明,触头表面与灭弧室固体分解产物的组成差异主要源自碳、氟、铜等元素迁移途径不同。触头表面腐蚀劣化主要由碳化、氧化、硫化引起;喷口腐蚀劣化主要由聚四氟乙烯的蒸发流失造成。Investigation of solid decomposition products is an essential scientific method to explore the corrosion mechanism of metallic organic material of SF_(6) circuit breaker.In this paper,the 40.5 kV SF_(6) circuit breaker is taken as the experimental object to study the influence of electrothermal corrosion of contact and nozzle body materials at different magnitude of current,polarity and interruption numbers.It is found after disassembly of the circuit breaker after interruption experiment that the corrosion of the moving and the stationary contacts is due to the high current in-terruption,the corrosion of the moving arc contact is accelerated by the interruption at positive polarity and the solid decomposition products are generated on the contact surface and bottom of interrupter.The chemical composition of the solid decomposition products are analyzed by such technologies as scanning electron microscope(SEM),X-ray energy spectroscopy(EDS)and Powder crystal diffraction(XRD),finding that the solid decomposition products on the contact surface include Cu_(2)O,Cu_(2)S,amorphous carbon and fluorocarbon deposition,and those at bottom of inter-rupter include CuF_(2),Cu_(2)O,SiO_(2) and polytetrafluoroethylene(PTFE)powder.The experimental results show that the composition difference of solid decomposition products on the contact surface and the interrupter is mainly due to the different migration paths of elements C,F and Cu etc.The corrosive degradation of the contact surface is due to car-bonization,oxidation and sulfuration,whilst the corrosive degradation of the nozzle results from vaporization and leaching of PTFE.

关 键 词：SF6断路器 开断实验 固体分解产物 化学分析 

分 类 号：TM561[电气工程—电器]