500 kV断路器并联电容高压介损试验研究  

Experimental Study on High Voltage Dielectric Loss of Shunt Capacitor for 500 kV Circuit Breaker

作　　者：唐信 熊云 毛学锋 廖子涵 李威 TANG Xin;XIONG Yun;MAO Xuefeng;LIAO Zihan;LI Wei(State Grid Hunan Extra High Voltage Substation Company,Changsha 410004,China;State Grid Hunan Electric Power Company Limited Substation Intelligent Operation and Inspection Laboratory,Changsha 410004,China)

机构地区：[1]国网湖南省电力有限公司超高压变电公司,湖南长沙410004 [2]变电智能运检国网湖南省电力有限公司实验室,湖南长沙410004

出　　处：《湖南电力》2022年第6期110-113,118,共5页Hunan Electric Power

摘　　要：针对现场高压断路器断口电容的常规介损试验经常出现试验介损值超出规程标准的情况,经过分析与试验验证,发现断口电容内部绝缘介质的Garton效应是引起低电压下介损异常的主要原因。通过对介损异常的断口电容进行高压介损试验,发现试验品介损值随试验电压增高出现规律性变化,当电压下降至10 kV时,介损值较施加高压前有明显改善,从而减小Garton效应对实际介损值的影响,并为判断断口电容是否存在真实绝缘异常提供有效依据。Conventional dielectric loss tests for coupling capacitor often yield values that exceed the standards. After analysis and verification, it is found that the Garton effect of the insulating medium inside the capacitors is the main reason for the abnormal dielectric loss at low voltage, which cannot reflect the real insulation defect inside the capacitor. Through the high-voltage dielectric loss test, it could be observed that the dielectric loss value of the capacitors changes regularly with increasing test voltage. When the voltage drops back to 10kV, compared with initial values, the dielectric loss values decreased significantly. In this method, the influence of the Garton effect on the actual dielectric loss value has been reduced, which also provides an effective basis for judging whether there is a real insulation abnormality in the breaker capacitance.

关 键 词：断口电容 绝缘测试 高压介损 GARTON效应 

分 类 号：TM561[电气工程—电器]