一种扩展紧缩场低频测试频率的时域测试方法  

A Time-domain Test Method for Low Frequency Test Frequency of Extended Compact Range

作　　者：马玉丰 李薇 胡鹏展 韩嘉维 MA Yufeng;LI Wei;HU Pengzhan;HAN Jiawei(Xi'an Branch of China Academy of Space Technology,Xi'an 710000,China)

机构地区：[1]中国空间技术研究院西安分院,陕西西安710000

出　　处：《数字通信世界》2022年第12期68-69,182,共3页Digital Communication World

摘　　要：文章介绍了一种提高紧缩场下限频率的时域测试方法,在现有紧缩场测试频率1~40 GHz的测试能力下,在不破坏原有系统硬件的情况下,利用现有的反射面系统,增加几台时域测试设备,可将紧缩场的下限测试频率由原来的截止频率1 GHz扩展至0.3~1 GHz,满足某些产品的测试要求,提高紧缩场的测试能力与测试精度,并且通过实验证明了该测试方法的可行性。This paper introduces a time-domain test method to improve the lower limit frequency of the compact range.Under the test ability of the existing compact range test frequency of 1~40 GHz,without damaging the original system hardware,using the existing reflector system and adding several time-domain test equipment,the lower limit test frequency of the compact range can be expanded from the original cut-off frequency of 1 GHz to 0.3~1 GHz,meeting the test requirements of some products,The test capability and precision of the compact range are improved,and the feasibility of the test method is proved by experiments.

关 键 词：紧缩场 时域测试 RCS 

分 类 号：TM936[电气工程—电力电子与电力传动]