一种低功耗高可靠性辐射加固锁存器设计  

Design of Latch with Low-power and High-reliability Radiation Reinforcement

作　　者：周静 徐辉[1] ZHOU Jing;XU Hui(School of Computer Science and Engineering,Anhui University of Science and Technology,Huainan Anhui 232001)

机构地区：[1]安徽理工大学计算机科学与工程学院,安徽淮南232001

出　　处：《湖北理工学院学报》2023年第1期1-5,49,共6页Journal of Hubei Polytechnic University

基　　金：国家自然科学基金面上项目(项目编号:61874156,61404001)。

摘　　要：为缓解因电荷共享引起的多节点翻转现象,提出了一种低功耗高可靠性的多节点翻转自恢复锁存器QNULH。QNULH锁存器包括4个反馈模块,每个模块充分利用C单元的反馈锁存数据,锁存器节点通过不同的排列组合叠加模块冗余,同时使用时钟钟控和快速通路技术,实现锁存器的低功耗高可靠性辐射加固。仿真实验结果表明,与最新的四节点翻转自恢复锁存器QNURL相比,QNULH锁存器的功耗、延迟、功耗延迟积分别降低了82.22%,1.53%,92.92%,对工艺、电源电压、温度的波动均较稳定,有较好的可靠性。In order to alleviate the multi-node flip-flop phenomenon caused by charge sharing,a low-power and high-reliability multi-node flip-flop self recovery latch QNULH is proposed.The QNULH latch consists of four feedback modules,each of which makes full use of the feedback latch data of the C-unit.The latch nodes are superimposed with module redundancy through different permutations and combinations,while using clock control and fast path technology to achieve low power consumption and high reliability radiation reinforcement of the latch.The simulation experimental results show that the power consumption,delay and power delay product(PDP)of the QNULH latch are reduced by 82.22%,1.53%and 92.92%respectively,compared with the latest four node flip self recovery latch QNURL.The QNULH latch is stable to the fluctuations of process,power supply voltage and temperature,and has good reliability.

关 键 词：电荷共享效应 电路可靠性 多节点翻转 软错误自恢复 

分 类 号：TN47[电子电信—微电子学与固体电子学]